Fournier, Bertrand, Coppens, Philip (2012) Measuring picosecond excited-state lifetimes at synchrotron sources. Journal of Synchrotron Radiation, 19 (4). 497-502 doi:10.1107/s0909049512010710
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Measuring picosecond excited-state lifetimes at synchrotron sources | ||
Journal | Journal of Synchrotron Radiation | ||
Authors | Fournier, Bertrand | Author | |
Coppens, Philip | Author | ||
Year | 2012 (July 1) | Volume | 19 |
Issue | 4 | ||
Publisher | International Union of Crystallography (IUCr) | ||
DOI | doi:10.1107/s0909049512010710Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 8486883 | Long-form Identifier | mindat:1:5:8486883:3 |
GUID | 0 | ||
Full Reference | Fournier, Bertrand, Coppens, Philip (2012) Measuring picosecond excited-state lifetimes at synchrotron sources. Journal of Synchrotron Radiation, 19 (4). 497-502 doi:10.1107/s0909049512010710 | ||
Plain Text | Fournier, Bertrand, Coppens, Philip (2012) Measuring picosecond excited-state lifetimes at synchrotron sources. Journal of Synchrotron Radiation, 19 (4). 497-502 doi:10.1107/s0909049512010710 | ||
In | (2012, July) Journal of Synchrotron Radiation Vol. 19 (4) International Union of Crystallography (IUCr) |
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