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Lombardo, Jeffrey J., Ristau, Roger A., Harris, William M., Chiu, Wilson K. S. (2012) Focused ion beam preparation of samples for X-ray nanotomography. Journal of Synchrotron Radiation, 19 (5). 789-796 doi:10.1107/s0909049512027252

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Reference TypeJournal (article/letter/editorial)
TitleFocused ion beam preparation of samples for X-ray nanotomography
JournalJournal of Synchrotron Radiation
AuthorsLombardo, Jeffrey J.Author
Ristau, Roger A.Author
Harris, William M.Author
Chiu, Wilson K. S.Author
Year2012 (September 1)Volume19
Issue5
PublisherInternational Union of Crystallography (IUCr)
DOIdoi:10.1107/s0909049512027252Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID8486961Long-form Identifiermindat:1:5:8486961:0
GUID0
Full ReferenceLombardo, Jeffrey J., Ristau, Roger A., Harris, William M., Chiu, Wilson K. S. (2012) Focused ion beam preparation of samples for X-ray nanotomography. Journal of Synchrotron Radiation, 19 (5). 789-796 doi:10.1107/s0909049512027252
Plain TextLombardo, Jeffrey J., Ristau, Roger A., Harris, William M., Chiu, Wilson K. S. (2012) Focused ion beam preparation of samples for X-ray nanotomography. Journal of Synchrotron Radiation, 19 (5). 789-796 doi:10.1107/s0909049512027252
In(2012, September) Journal of Synchrotron Radiation Vol. 19 (5) International Union of Crystallography (IUCr)

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