Reference Type | Journal (article/letter/editorial) |
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Title | Laser patterning and critical current measurements of submicrometer lines of Y‐Ba‐Cu‐O |
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Journal | Applied Physics Letters |
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Authors | Zheng, J. P. | Author |
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Kim, H. S. | Author |
Ying, Q. Y. | Author |
Barone, R. | Author |
Bush, P. | Author |
Shaw, D. T. | Author |
Kwok, H. S. | Author |
Year | 1989 (September 4) | Volume | 55 |
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Issue | 10 |
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Publisher | AIP Publishing |
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DOI | doi:10.1063/1.101726Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 8487753 | Long-form Identifier | mindat:1:5:8487753:0 |
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GUID | 0 |
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Full Reference | Zheng, J. P., Kim, H. S., Ying, Q. Y., Barone, R., Bush, P., Shaw, D. T., Kwok, H. S. (1989) Laser patterning and critical current measurements of submicrometer lines of Y‐Ba‐Cu‐O. Applied Physics Letters, 55 (10). 1044-1046 doi:10.1063/1.101726 |
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Plain Text | Zheng, J. P., Kim, H. S., Ying, Q. Y., Barone, R., Bush, P., Shaw, D. T., Kwok, H. S. (1989) Laser patterning and critical current measurements of submicrometer lines of Y‐Ba‐Cu‐O. Applied Physics Letters, 55 (10). 1044-1046 doi:10.1063/1.101726 |
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In | (1989, September) Applied Physics Letters Vol. 55 (10) AIP Publishing |
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