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Wang, Hong, Sun, Guangai, Wang, Xiaolin, Chen, Bo, Zu, Xiaotao, Liu, Yanping, Li, Liangbin, Pan, Guoqiang, Sheng, Liusi, Liu, Yaoguang, Fu, Yong Qing (2015) In situsynchrotron X-ray diffraction analysis of deformation behaviour in Ti–Ni-based thin films. Journal of Synchrotron Radiation, 22 (1). 34-41 doi:10.1107/s1600577514021031

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Reference TypeJournal (article/letter/editorial)
TitleIn situsynchrotron X-ray diffraction analysis of deformation behaviour in Ti–Ni-based thin films
JournalJournal of Synchrotron Radiation
AuthorsWang, HongAuthor
Sun, GuangaiAuthor
Wang, XiaolinAuthor
Chen, BoAuthor
Zu, XiaotaoAuthor
Liu, YanpingAuthor
Li, LiangbinAuthor
Pan, GuoqiangAuthor
Sheng, LiusiAuthor
Liu, YaoguangAuthor
Fu, Yong QingAuthor
Year2015 (January 1)Volume22
Issue1
PublisherInternational Union of Crystallography (IUCr)
DOIdoi:10.1107/s1600577514021031Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID8487792Long-form Identifiermindat:1:5:8487792:9
GUID0
Full ReferenceWang, Hong, Sun, Guangai, Wang, Xiaolin, Chen, Bo, Zu, Xiaotao, Liu, Yanping, Li, Liangbin, Pan, Guoqiang, Sheng, Liusi, Liu, Yaoguang, Fu, Yong Qing (2015) In situsynchrotron X-ray diffraction analysis of deformation behaviour in Ti–Ni-based thin films. Journal of Synchrotron Radiation, 22 (1). 34-41 doi:10.1107/s1600577514021031
Plain TextWang, Hong, Sun, Guangai, Wang, Xiaolin, Chen, Bo, Zu, Xiaotao, Liu, Yanping, Li, Liangbin, Pan, Guoqiang, Sheng, Liusi, Liu, Yaoguang, Fu, Yong Qing (2015) In situsynchrotron X-ray diffraction analysis of deformation behaviour in Ti–Ni-based thin films. Journal of Synchrotron Radiation, 22 (1). 34-41 doi:10.1107/s1600577514021031
In(2015, January) Journal of Synchrotron Radiation Vol. 22 (1) International Union of Crystallography (IUCr)

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