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Kashyap, Yogesh, Wang, Hongchang, Sawhney, Kawal (2016) Development of a speckle-based portable device forin situmetrology of synchrotron X-ray mirrors. Journal of Synchrotron Radiation, 23 (5). 1131-1136 doi:10.1107/s1600577516012509

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Reference TypeJournal (article/letter/editorial)
TitleDevelopment of a speckle-based portable device forin situmetrology of synchrotron X-ray mirrors
JournalJournal of Synchrotron Radiation
AuthorsKashyap, YogeshAuthor
Wang, HongchangAuthor
Sawhney, KawalAuthor
Year2016 (September 1)Volume23
Issue5
PublisherInternational Union of Crystallography (IUCr)
DOIdoi:10.1107/s1600577516012509Search in ResearchGate
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Mindat Ref. ID8488547Long-form Identifiermindat:1:5:8488547:8
GUID0
Full ReferenceKashyap, Yogesh, Wang, Hongchang, Sawhney, Kawal (2016) Development of a speckle-based portable device forin situmetrology of synchrotron X-ray mirrors. Journal of Synchrotron Radiation, 23 (5). 1131-1136 doi:10.1107/s1600577516012509
Plain TextKashyap, Yogesh, Wang, Hongchang, Sawhney, Kawal (2016) Development of a speckle-based portable device forin situmetrology of synchrotron X-ray mirrors. Journal of Synchrotron Radiation, 23 (5). 1131-1136 doi:10.1107/s1600577516012509
In(2016, September) Journal of Synchrotron Radiation Vol. 23 (5) International Union of Crystallography (IUCr)

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Wang, Hongchang, Kashyap, Yogesh, Laundy, David, Sawhney, Kawal (2015) Two-dimensionalin situmetrology of X-ray mirrors using the speckle scanning technique. Journal of Synchrotron Radiation, 22 (4). 925-929 doi:10.1107/s1600577515006657
Wang, Hongchang, Kashyap, Yogesh, Sawhney, Kawal (2016) From synchrotron radiation to lab source: advanced speckle-based X-ray imaging using abrasive paper. Scientific Reports, 6. doi:10.1038/srep20476
Kashyap, Yogesh, Wang, Hongchang, Sawhney, Kawal (2016) Speckle-based at-wavelength metrology of X-ray mirrors with super accuracy. Review of Scientific Instruments, 87 (5). 52001pp. doi:10.1063/1.4949004
Sutter, John P., Alcock, Simon G., Kashyap, Yogesh, Nistea, Ioana, Wang, Hongchang, Sawhney, Kawal (2016) Creating flat-top X-ray beams by applying surface profiles of alternating curvature to deformable piezo bimorph mirrors. Journal of Synchrotron Radiation, 23 (6). 1333-1347 doi:10.1107/s1600577516013308
Wang, Hongchang, Kashyap, Yogesh, Sawhney, Kawal (2016) Quantitative X-ray dark-field and phase tomography using single directional speckle scanning technique. Applied Physics Letters, 108 (12). 124102pp. doi:10.1063/1.4944462
Zhou, Tunhe, Wang, Hongchang, Connolley, Thomas, Scott, Steward, Baker, Nick, Sawhney, Kawal (2018) Development of an X-ray imaging system to prevent scintillator degradation for white synchrotron radiation. Journal of Synchrotron Radiation, 25 (3). 801-807 doi:10.1107/s1600577518003193
Kashyap, Yogesh, Wang, Hongchang, Sawhney, Kawal (2015) Two-dimensional transverse coherence measurement of hard-x-ray beams using near-field speckle. Physical Review A, 92 (3). doi:10.1103/physreva.92.033842
Wang, Hongchang, Cai, Biao, Pankhurst, Matthew James, Zhou, Tunhe, Kashyap, Yogesh, Atwood, Robert, Le Gall, Nolwenn, Lee, Peter, Drakopoulos, Michael, Sawhney, Kawal (2018) X-ray phase-contrast imaging with engineered porous materials over 50 keV. Journal of Synchrotron Radiation, 25 (4). 1182-1188 doi:10.1107/s1600577518005623
Wang, Hongchang, Kashyap, Yogesh, Sawhney, Kawal (2015) Hard-X-Ray Directional Dark-Field Imaging Using the Speckle Scanning Technique. Physical Review Letters, 114 (10). doi:10.1103/physrevlett.114.103901
Hand, Matthew, Wang, Hongchang, Dhesi, Sarnjeet S., Sawhney, Kawal (2016) Investigation of the polarization state of dual APPLE-II undulators. Journal of Synchrotron Radiation, 23 (1). 176-181 doi:10.1107/s1600577515021645
Wang, Hongchang, Kashyap, Yogesh, Cai, Biao, Sawhney, Kawal (2016) High energy X-ray phase and dark-field imaging using a random absorption mask. Scientific Reports, 6. doi:10.1038/srep30581
 
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