Vote for your favorite mineral in #MinCup25! - Cuprosklodowskite vs. Ikaite
It's radioactive #cuprosklodowskite vs ephemeral #ikaite for today's match.
Log InRegister
Quick Links : The Mindat ManualThe Rock H. Currier Digital LibraryMindat Newsletter [Free Download]
Home PageAbout MindatThe Mindat ManualHistory of MindatCopyright StatusWho We AreContact UsAdvertise on Mindat
Donate to MindatCorporate SponsorshipSponsor a PageSponsored PagesMindat AdvertisersAdvertise on Mindat
Learning CenterWhat is a mineral?The most common minerals on earthInformation for EducatorsMindat ArticlesThe ElementsThe Rock H. Currier Digital LibraryGeologic Time
Minerals by PropertiesMinerals by ChemistryAdvanced Locality SearchRandom MineralRandom LocalitySearch by minIDLocalities Near MeSearch ArticlesSearch GlossaryMore Search Options
Search For:
Mineral Name:
Locality Name:
Keyword(s):
 
The Mindat ManualAdd a New PhotoRate PhotosLocality Edit ReportCoordinate Completion ReportAdd Glossary Item
Mining CompaniesStatisticsUsersMineral MuseumsClubs & OrganizationsMineral Shows & EventsThe Mindat DirectoryDevice SettingsThe Mineral Quiz
Photo SearchPhoto GalleriesSearch by ColorNew Photos TodayNew Photos YesterdayMembers' Photo GalleriesPast Photo of the Day GalleryPhotography

Unuigbe, David M., Harting, Margit, Jonah, Emmanuel O., Britton, David T., Nordlund, Dennis (2017) Investigation of nanoparticulate silicon as printed layers using scanning electron microscopy, transmission electron microscopy, X-ray absorption spectroscopy and X-ray photoelectron spectroscopy. Journal of Synchrotron Radiation, 24 (5). 1017-1023 doi:10.1107/s1600577517009857

Advanced
   -   Only viewable:
Reference TypeJournal (article/letter/editorial)
TitleInvestigation of nanoparticulate silicon as printed layers using scanning electron microscopy, transmission electron microscopy, X-ray absorption spectroscopy and X-ray photoelectron spectroscopy
JournalJournal of Synchrotron Radiation
AuthorsUnuigbe, David M.Author
Harting, MargitAuthor
Jonah, Emmanuel O.Author
Britton, David T.Author
Nordlund, DennisAuthor
Year2017 (September 1)Volume24
Issue5
PublisherInternational Union of Crystallography (IUCr)
DOIdoi:10.1107/s1600577517009857Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID8488876Long-form Identifiermindat:1:5:8488876:7
GUID0
Full ReferenceUnuigbe, David M., Harting, Margit, Jonah, Emmanuel O., Britton, David T., Nordlund, Dennis (2017) Investigation of nanoparticulate silicon as printed layers using scanning electron microscopy, transmission electron microscopy, X-ray absorption spectroscopy and X-ray photoelectron spectroscopy. Journal of Synchrotron Radiation, 24 (5). 1017-1023 doi:10.1107/s1600577517009857
Plain TextUnuigbe, David M., Harting, Margit, Jonah, Emmanuel O., Britton, David T., Nordlund, Dennis (2017) Investigation of nanoparticulate silicon as printed layers using scanning electron microscopy, transmission electron microscopy, X-ray absorption spectroscopy and X-ray photoelectron spectroscopy. Journal of Synchrotron Radiation, 24 (5). 1017-1023 doi:10.1107/s1600577517009857
In(2017, September) Journal of Synchrotron Radiation Vol. 24 (5) International Union of Crystallography (IUCr)

See Also

These are possibly similar items as determined by title/reference text matching only.

Jonah, Emmanuel O., Härting, Margit, Gullikson, Eric, Aquila, Andrew, Britton, David T. (2014) Investigation of surface topology of printed nanoparticle layers using wide-angle low-Qscattering. Journal of Synchrotron Radiation, 21 (3). 547-553 doi:10.1107/s160057751400410x
Castner, David G., Watson, Philip R., Chan, Ignatius Y. (1989) X-ray absorption spectroscopy, x-ray photoelectron spectroscopy, and analytical electron microscopy studies of cobalt catalysts. 1. Characterization of calcined catalysts. The Journal of Physical Chemistry, 93 (8). 3188-3194 doi:10.1021/j100345a061
Castner, David G., Watson, Philip R., Chan, Ignatius Y. (1990) X-ray absorption spectroscopy, x-ray photoelectron spectroscopy, and analytical electron microscopy studies of cobalt catalysts. 2. Hydrogen reduction properties. The Journal of Physical Chemistry, 94 (2). 819-828 doi:10.1021/j100365a057
Seibert, Rachel L., Terry, Jeff, Parish, Chad M., Hunn, John D., Baldwin, Charles A., Terrani, Kurt A. (2017) Structural Characterization of Fission Products in Irradiated TRISO Fuels using Transmission Kikuchi Diffraction, Transmission Electron Microscopy, and Synchrotron X-ray Absorption Spectroscopy. Microscopy and Microanalysis, 23. 2228-2229 doi:10.1017/s1431927617011801
Neidhardt, J., Hultman, L., Czigány, Zs. (2004) Correlated high resolution transmission electron microscopy and X-ray photoelectron spectroscopy studies of structured CNx (0Carbon, 42. 2729-2734 doi:10.1016/j.carbon.2004.06.011
Qin, Zhenyu, Lai, Barry, Landero, Julio, Caruso, Joseph A. (2012) Coupling transmission electron microscopy with synchrotron radiation X-ray fluorescence microscopy to image vascular copper. Journal of Synchrotron Radiation, 19 (6). 1043-1049 doi:10.1107/s090904951203405x
Mykhaylyk, Oleksandr O., Solonin, Yurii M., Batchelder, David N., Brydson, Rik (2005) Transformation of nanodiamond into carbon onions: A comparative study by high-resolution transmission electron microscopy, electron energy-loss spectroscopy, x-ray diffraction, small-angle x-ray scattering, and ultraviolet Raman spectroscopy. Journal of Applied Physics, 97 (7). 74302pp. doi:10.1063/1.1868054
Klenov, D.O. (2012) Detection of individual atoms with energy dispersive x-ray spectroscopy in scanning transmission electron microscopy. Microscopy and Microanalysis, 18. 990-991 doi:10.1017/s1431927612006800
Lazik, C, Conti, G, Uritsky, Y (2007) Characterization of Nitrogen Content/Distribution in SiON Gate Dielectrics using Angle-Resolved X-Ray Photoelectron Spectroscopy (AR-XPS) and Aberration Corrected Scanning Transmission Electron Spectroscopy (Cs-STEM). Microscopy and Microanalysis, 13. doi:10.1017/s1431927607075113
Watanabe, Heiji, Ichikawa, Masakazu (1996) Development of a multifunctional surface analysis system based on a nanometer scale scanning electron beam: Combination of ultrahigh vacuum‐scanning electron microscopy, scanning reflection electron microscopy, Auger electron spectroscopy, and x‐ray photoelectron spectroscopy. Review of Scientific Instruments, 67 (12). 4185-4190 doi:10.1063/1.1147567
Walther, T, Wang, X (2015) Self-consistent absorption correction for quantitative energy- dispersive X-ray spectroscopy of InGaN layers in analytical transmission electron microscopy. Journal of Physics: Conference Series, 644. 12006pp. doi:10.1088/1742-6596/644/1/012006
 
and/or  
Mindat.org is an outreach project of the Hudson Institute of Mineralogy, a 501(c)(3) not-for-profit organization.
Copyright © mindat.org and the Hudson Institute of Mineralogy 1993-2025, except where stated. Most political location boundaries are © OpenStreetMap contributors. Mindat.org relies on the contributions of thousands of members and supporters. Founded in 2000 by Jolyon Ralph.
To cite: Ralph, J., Von Bargen, D., Martynov, P., Zhang, J., Que, X., Prabhu, A., Morrison, S. M., Li, W., Chen, W., & Ma, X. (2025). Mindat.org: The open access mineralogy database to accelerate data-intensive geoscience research. American Mineralogist, 110(6), 833–844. doi:10.2138/am-2024-9486.
Privacy Policy - Terms & Conditions - Contact Us / DMCA issues - Report a bug/vulnerability Current server date and time: September 14, 2025 07:20:40
Go to top of page