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Levenson, L. L. (1989) Grain boundary diffusion activation energy derived from surface roughness measurements of aluminum thin films. Applied Physics Letters, 55 (25). 2617-2619 doi:10.1063/1.102270

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Reference TypeJournal (article/letter/editorial)
TitleGrain boundary diffusion activation energy derived from surface roughness measurements of aluminum thin films
JournalApplied Physics Letters
AuthorsLevenson, L. L.Author
Year1989 (December 18)Volume55
Issue25
PublisherAIP Publishing
DOIdoi:10.1063/1.102270Search in ResearchGate
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Mindat Ref. ID8488919Long-form Identifiermindat:1:5:8488919:1
GUID0
Full ReferenceLevenson, L. L. (1989) Grain boundary diffusion activation energy derived from surface roughness measurements of aluminum thin films. Applied Physics Letters, 55 (25). 2617-2619 doi:10.1063/1.102270
Plain TextLevenson, L. L. (1989) Grain boundary diffusion activation energy derived from surface roughness measurements of aluminum thin films. Applied Physics Letters, 55 (25). 2617-2619 doi:10.1063/1.102270
In(1989, December) Applied Physics Letters Vol. 55 (25) AIP Publishing

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Chou, L. H. (1991) Surface‐energy‐driven secondary grain growth in thin Sb films. Applied Physics Letters, 58 (23). 2631-2633 doi:10.1063/1.104816
Gilmer, G. H., Farrell, H. H. (1976) Grain‐boundary diffusion in thin films. II. Multiple grain boundaries and surface diffusion. Journal of Applied Physics, 47 (10). 4373-4380 doi:10.1063/1.322441
Logothetidis, S. (1989) Surface‐roughness and grain‐boundary effects on the optical properties of low‐pressure chemical‐vapor‐deposited silicon thin films by spectroscopic ellipsometry. Journal of Applied Physics, 65 (6). 2416-2426 doi:10.1063/1.343401
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Gilmer, G. H., Farrell, H. H. (1976) Grain‐boundary diffusion in thin films: I. The isolated grain boundary. Journal of Applied Physics, 47 (9). 3792-3798 doi:10.1063/1.323264
Ritter, M., Hülsing, H., Wolf, W. P. (1984) Magneto‐optical method for ac susceptibility measurements. Journal of Applied Physics, 55 (6). 2617-2619 doi:10.1063/1.333255
Butcher, B. M., Hutto, H., Ruoff, A. L. (1965) ACTIVATION VOLUME AND ENERGY FOR SELF‐DIFFUSION IN ALUMINUM. Applied Physics Letters, 7 (2). 34-35 doi:10.1063/1.1754285
Butcher, B. M., Hutto, H., Ruoff, A. L. (1965) ERRATA: Activation Volume and Energy for Self‐Diffusion in Aluminum. Applied Physics Letters, 7 (4). 112 doi:10.1063/1.1754317
Yousef, Y. L., Kamel, R. (1954) Elastic Relaxation and Grain Boundary Diffusion in Cadmium. Journal of Applied Physics, 25 (8). 1064 doi:10.1063/1.1721800
Berenbaum, L. (1971) Electromigration Damage of Grain‐Boundary Triple Points in Al Thin Films. Journal of Applied Physics, 42 (2). 880-882 doi:10.1063/1.1660116
Rosenberg, R. (1970) VALUE D0Z* FOR GRAIN BOUNDARY ELECTROMIGRATION IN ALUMINUM FILMS. Applied Physics Letters, 16 (1). 27-29 doi:10.1063/1.1653018
 
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