Kato, Kenichi, Tanaka, Yoshihito, Yamauchi, Miho, Ohara, Koji, Hatsui, Takaki (2019) A statistical approach to correct X-ray response non-uniformity in microstrip detectors for high-accuracy and high-resolution total-scattering measurements. Journal of Synchrotron Radiation, 26 (3). 762-773 doi:10.1107/s1600577519002145
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | A statistical approach to correct X-ray response non-uniformity in microstrip detectors for high-accuracy and high-resolution total-scattering measurements | ||
| Journal | Journal of Synchrotron Radiation | ||
| Authors | Kato, Kenichi | Author | |
| Tanaka, Yoshihito | Author | ||
| Yamauchi, Miho | Author | ||
| Ohara, Koji | Author | ||
| Hatsui, Takaki | Author | ||
| Year | 2019 (May 1) | Volume | 26 |
| Issue | 3 | ||
| Publisher | International Union of Crystallography (IUCr) | ||
| DOI | doi:10.1107/s1600577519002145Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 8489568 | Long-form Identifier | mindat:1:5:8489568:8 |
| GUID | 0 | ||
| Full Reference | Kato, Kenichi, Tanaka, Yoshihito, Yamauchi, Miho, Ohara, Koji, Hatsui, Takaki (2019) A statistical approach to correct X-ray response non-uniformity in microstrip detectors for high-accuracy and high-resolution total-scattering measurements. Journal of Synchrotron Radiation, 26 (3). 762-773 doi:10.1107/s1600577519002145 | ||
| Plain Text | Kato, Kenichi, Tanaka, Yoshihito, Yamauchi, Miho, Ohara, Koji, Hatsui, Takaki (2019) A statistical approach to correct X-ray response non-uniformity in microstrip detectors for high-accuracy and high-resolution total-scattering measurements. Journal of Synchrotron Radiation, 26 (3). 762-773 doi:10.1107/s1600577519002145 | ||
| In | (2019, May) Journal of Synchrotron Radiation Vol. 26 (3) International Union of Crystallography (IUCr) | ||
See Also
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