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Moreland, John, Rice, Paul, Russek, S. E., Jeanneret, B., Roshko, A., Ono, R. H., Rudman, D. A. (1991) Scanning tunneling microscopy of the surface morphology of YBa2Cu3Oxthin films between 300 and 76 K. Applied Physics Letters, 59 (23). 3039-3041 doi:10.1063/1.105786

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Reference TypeJournal (article/letter/editorial)
TitleScanning tunneling microscopy of the surface morphology of YBa2Cu3Oxthin films between 300 and 76 K
JournalApplied Physics Letters
AuthorsMoreland, JohnAuthor
Rice, PaulAuthor
Russek, S. E.Author
Jeanneret, B.Author
Roshko, A.Author
Ono, R. H.Author
Rudman, D. A.Author
Year1991 (December 2)Volume59
Issue23
PublisherAIP Publishing
DOIdoi:10.1063/1.105786Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID8496614Long-form Identifiermindat:1:5:8496614:4
GUID0
Full ReferenceMoreland, John, Rice, Paul, Russek, S. E., Jeanneret, B., Roshko, A., Ono, R. H., Rudman, D. A. (1991) Scanning tunneling microscopy of the surface morphology of YBa2Cu3Oxthin films between 300 and 76 K. Applied Physics Letters, 59 (23). 3039-3041 doi:10.1063/1.105786
Plain TextMoreland, John, Rice, Paul, Russek, S. E., Jeanneret, B., Roshko, A., Ono, R. H., Rudman, D. A. (1991) Scanning tunneling microscopy of the surface morphology of YBa2Cu3Oxthin films between 300 and 76 K. Applied Physics Letters, 59 (23). 3039-3041 doi:10.1063/1.105786
In(1991, December) Applied Physics Letters Vol. 59 (23) AIP Publishing

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Harvey, T. E., Moreland, J., Jeanneret, B., Ono, R. H., Rudman, D. A. (1992) YBa2Cu3O7−xto Si interconnection for hybrid superconductor/ semiconductor integrationa). Applied Physics Letters, 61 (18). 2225-2227 doi:10.1063/1.108275
Thomson, R. E., Moreland, J., Missert, N., Rudman, D. A., Sanders, S. C., Cole, B. F. (1993) Insulating nanoparticles on YBa2Cu3O7−δthin films revealed by comparison of atomic force and scanning tunneling microscopy. Applied Physics Letters, 63 (5). 614-616 doi:10.1063/1.109966
Moreland, John, Ono, R. H., Beall, J. A., Madden, M., Nelson, A. J. (1989) Evidence for the superconducting proximity effect in junctions between the surfaces of YBa2Cu3Oxthin films. Applied Physics Letters, 54 (15). 1477-1479 doi:10.1063/1.101409
Moreland, John, Rice, Paul (1991) Tunneling stabilized, magnetic force microscopy with a gold‐coated, nickel‐film tipa). Journal of Applied Physics, 70 (1). 520-522 doi:10.1063/1.350266
Russek, S. E., Sanders, S. C., Roshko, A., Ekin, J. W. (1994) Surface degradation of superconducting YBa2Cu3O7−δthin films. Applied Physics Letters, 64 (26). 3649-3651 doi:10.1063/1.111192
de Obaldia, E. I., Ludwig, K. F., Berkowitz, S. J., Clark, A. M., Skocpol, W. J., Mankiewich, P. M., Rudman, D. A., Roshko, A., Moerman, R., Vale, L., Ono, R. H. (1994) Coexistence of grains with differing orthorhombicity in high quality YBa2Cu3O7−δthin films. Applied Physics Letters, 65 (26). 3395-3397 doi:10.1063/1.112402
Morita, Y., Miki, K., Tokumoto, H. (1991) Direct observation of SiH3on a 1%‐HF‐treated Si(111) surface by scanning tunneling microscopy. Applied Physics Letters, 59 (11). 1347-1349 doi:10.1063/1.105304
Lathrop, D. K., Moeckly, B. H., Russek, S. E., Buhrman, R. A. (1991) Transport properties of high‐angle grain boundary weak links in YBa2Cu3O7thin films. Applied Physics Letters, 58 (10). 1095-1097 doi:10.1063/1.104382
Moreland, John, Rice, Paul (1990) High‐resolution, tunneling‐stabilized magnetic imaging and recording. Applied Physics Letters, 57 (3). 310-312 doi:10.1063/1.103676
Shekhawat, G. S., Gupta, Ram P., Agarwal, A., Garg, K. B., Vyas, P. D. (1995) Pattern generation on silicon surfaces and YBa2Cu3Oxthin films by a scanning tunneling microscope. Journal of Applied Physics, 78 (1). 127-131 doi:10.1063/1.360662
Shigekawa, H., Hashizume, T., Oigawa, H., Motai, K., Mera, Y., Nannichi, Y., Sakurai, T. (1991) Surface structure of selenium‐treated GaAs (001) studied by field ion scanning tunneling microscopy. Applied Physics Letters, 59 (23). 2986-2988 doi:10.1063/1.106401
 
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