Reference Type | Journal (article/letter/editorial) |
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Title | Low‐energy ion scattering spectroscopy observations ofc‐axis‐oriented YBa2Cu3O7−xthin films: Effects of in‐vacuum annealing |
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Journal | Applied Physics Letters |
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Authors | Tanaka, S. | Author |
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Nakamura, T. | Author |
Iiyama, M. | Author |
Yoshida, N. | Author |
Takano, S. | Author |
Shoji, F. | Author |
Oura, K. | Author |
Year | 1991 (December 30) | Volume | 59 |
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Issue | 27 |
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Publisher | AIP Publishing |
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DOI | doi:10.1063/1.105604Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 8496985 | Long-form Identifier | mindat:1:5:8496985:9 |
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GUID | 0 |
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Full Reference | Tanaka, S., Nakamura, T., Iiyama, M., Yoshida, N., Takano, S., Shoji, F., Oura, K. (1991) Low‐energy ion scattering spectroscopy observations ofc‐axis‐oriented YBa2Cu3O7−xthin films: Effects of in‐vacuum annealing. Applied Physics Letters, 59 (27). 3637-3639 doi:10.1063/1.105604 |
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Plain Text | Tanaka, S., Nakamura, T., Iiyama, M., Yoshida, N., Takano, S., Shoji, F., Oura, K. (1991) Low‐energy ion scattering spectroscopy observations ofc‐axis‐oriented YBa2Cu3O7−xthin films: Effects of in‐vacuum annealing. Applied Physics Letters, 59 (27). 3637-3639 doi:10.1063/1.105604 |
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In | (1991, December) Applied Physics Letters Vol. 59 (27) AIP Publishing |
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