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Moeckly, B. H., Buhrman, R. A. (1994) Josephson properties of basal‐plane‐faced tilt boundaries in YBa2Cu3O7−δthin films. Applied Physics Letters, 65 (24). 3126-3128 doi:10.1063/1.112457

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Reference TypeJournal (article/letter/editorial)
TitleJosephson properties of basal‐plane‐faced tilt boundaries in YBa2Cu3O7−δthin films
JournalApplied Physics Letters
AuthorsMoeckly, B. H.Author
Buhrman, R. A.Author
Year1994 (December 12)Volume65
Issue24
PublisherAIP Publishing
DOIdoi:10.1063/1.112457Search in ResearchGate
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Mindat Ref. ID8510669Long-form Identifiermindat:1:5:8510669:7
GUID0
Full ReferenceMoeckly, B. H., Buhrman, R. A. (1994) Josephson properties of basal‐plane‐faced tilt boundaries in YBa2Cu3O7−δthin films. Applied Physics Letters, 65 (24). 3126-3128 doi:10.1063/1.112457
Plain TextMoeckly, B. H., Buhrman, R. A. (1994) Josephson properties of basal‐plane‐faced tilt boundaries in YBa2Cu3O7−δthin films. Applied Physics Letters, 65 (24). 3126-3128 doi:10.1063/1.112457
In(1994, December) Applied Physics Letters Vol. 65 (24) AIP Publishing

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Lew, D. J., Suzuki, Y., Marshall, A. F., Geballe, T. H., Beasley, M. R. (1994) Transport through 90° [010] basal‐plane‐faced tilt and twist grain boundaries in YBa2Cu3O7−δthin films. Applied Physics Letters, 65 (12). 1584-1586 doi:10.1063/1.112969
Sydow, J. P., Buhrman, R. A., Moeckly, B. H. (1998) Basal plane oxygen vapor pressure of Co-doped YBa2Cu3O7−δ. Applied Physics Letters, 72 (26). 3512-3514 doi:10.1063/1.121644
Russek, S. E., Lathrop, D. K., Moeckly, B. H., Buhrman, R. A., Shin, D. H., Silcox, J. (1990) Scaling behavior of YBa2Cu3O7−δthin‐film weak links. Applied Physics Letters, 57 (11). 1155-1157 doi:10.1063/1.104223
Shin, D. H., Silcox, J., Russek, S. E., Lathrop, D. K., Moeckly, B., Buhrman, R. A. (1990) Clean grain boundaries and weak links in highTcsuperconducting YBa2Cu3O7−xthin films. Applied Physics Letters, 57 (5). 508-510 doi:10.1063/1.104242
Moeckly, B. H., Buhrman, R. A., Sulewski, P. E. (1994) Micro‐Raman spectroscopy of electromigration‐induced oxygen vacancy aggregation in YBa2Cu3O7−δ. Applied Physics Letters, 64 (11). 1427-1429 doi:10.1063/1.111905
Ishimaru, Yoshihiro, Hayashi, Kunihiko, Enomoto, Youichi (1995) Properties of Basal-Plane-Faced Tilt Boundary Josephson Junction in YBCO Films. Japanese Journal of Applied Physics, 34. doi:10.1143/jjap.34.l1123
Moeckly, Brian H., Char, Kookrin (2002) Transport properties of high-angle grain boundaries in Co-dopedYBa2Cu3O7−δthin films. Physical Review B, 65 (17) doi:10.1103/physrevb.65.174504
Lathrop, D. K., Moeckly, B. H., Russek, S. E., Buhrman, R. A. (1991) Transport properties of high‐angle grain boundary weak links in YBa2Cu3O7thin films. Applied Physics Letters, 58 (10). 1095-1097 doi:10.1063/1.104382
Young, K. H., Sun, J. Z. (1991) Synthesis of in‐plane aligneda‐axis YBa2Cu3O7−δthin films. Applied Physics Letters, 59 (19). 2448-2450 doi:10.1063/1.105991
Moeckly, B. H., Russek, S. E., Lathrop, D. K., Buhrman, R. A., Norton, M. G., Carter, C. B. (1990) Growth and properties of YBa2Cu3O7thin films on vicinal and polycrystalline MgO substrates. Applied Physics Letters, 57 (27). 2951-2953 doi:10.1063/1.104208
Moeckly, B. H., Lathrop, D. K., Buhrman, R. A. (1993) Electromigration study of oxygen disorder and grain-boundary effects inYBa2Cu3O7−δthin films. Physical Review B, 47 (1) 400-417 doi:10.1103/physrevb.47.400
 
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