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Salnick, A., Mandelis, A., Jean, C. (1997) Infrared photothermal radiometric deep-level transient spectroscopy of shallow B+ dopant states in p-Si. Applied Physics Letters, 71 (18). 2671-2673 doi:10.1063/1.120174

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Reference TypeJournal (article/letter/editorial)
TitleInfrared photothermal radiometric deep-level transient spectroscopy of shallow B+ dopant states in p-Si
JournalApplied Physics Letters
AuthorsSalnick, A.Author
Mandelis, A.Author
Jean, C.Author
Year1997 (November 3)Volume71
Issue18
PublisherAIP Publishing
DOIdoi:10.1063/1.120174Search in ResearchGate
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Mindat Ref. ID8519783Long-form Identifiermindat:1:5:8519783:9
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Full ReferenceSalnick, A., Mandelis, A., Jean, C. (1997) Infrared photothermal radiometric deep-level transient spectroscopy of shallow B+ dopant states in p-Si. Applied Physics Letters, 71 (18). 2671-2673 doi:10.1063/1.120174
Plain TextSalnick, A., Mandelis, A., Jean, C. (1997) Infrared photothermal radiometric deep-level transient spectroscopy of shallow B+ dopant states in p-Si. Applied Physics Letters, 71 (18). 2671-2673 doi:10.1063/1.120174
In(1997, November) Applied Physics Letters Vol. 71 (18) AIP Publishing

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Mandelis, A., Budiman, R. A., Vargas, M., Wolff, D. (1995) Noncontact photothermal infrared radiometric deepā€level transient spectroscopy of GaAs wafers. Applied Physics Letters, 67 (11). 1582-1584 doi:10.1063/1.114946
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Hyun, C. H., Shur, M. S., Madan, A. (1982) Determination of the density of localized states in fluorinatedaā€Si using deep level transient spectroscopy. Applied Physics Letters, 41 (2). 178-180 doi:10.1063/1.93453
GonzƔlez, M., Carlin, A. M., Dohrman, C. L., Fitzgerald, E. A., Ringel, S. A. (2011) Determination of bandgap states in p-type In0.49Ga0.51P grown on SiGe/Si and GaAs by deep level optical spectroscopy and deep level transient spectroscopy. Journal of Applied Physics, 109 (6). 63709pp. doi:10.1063/1.3559739
Chen, Zhuohui, Mandelis, Andreas (1991) Effects of secondary laser illumination during the transient measurement in optical and electrical deep level transient spectroscopy. Applied Physics Letters, 59 (15). 1861-1863 doi:10.1063/1.106169
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