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Nagy, G., Levy, M., Scarmozzino, R., Osgood, R. M., Dai, H., Smalley, R. E., Michaels, C. A., Sevy, E. T., Flynn, G. W., McLane, G. F. (1998) Erratum: “Carbon nanotube tipped atomic force microscopy for measurement of <100 nm etch morphology on semiconductors” [Appl. Phys. Lett. 73, 529 (1998)]. Applied Physics Letters, 73 (10). 1448 doi:10.1063/1.122171

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Reference TypeJournal (article/letter/editorial)
TitleErratum: “Carbon nanotube tipped atomic force microscopy for measurement of <100 nm etch morphology on semiconductors” [Appl. Phys. Lett. 73, 529 (1998)]
JournalApplied Physics Letters
AuthorsNagy, G.Author
Levy, M.Author
Scarmozzino, R.Author
Osgood, R. M.Author
Dai, H.Author
Smalley, R. E.Author
Michaels, C. A.Author
Sevy, E. T.Author
Flynn, G. W.Author
McLane, G. F.Author
Year1998 (September 7)Volume73
Issue10
PublisherAIP Publishing
DOIdoi:10.1063/1.122171Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID8521785Long-form Identifiermindat:1:5:8521785:0
GUID0
Full ReferenceNagy, G., Levy, M., Scarmozzino, R., Osgood, R. M., Dai, H., Smalley, R. E., Michaels, C. A., Sevy, E. T., Flynn, G. W., McLane, G. F. (1998) Erratum: “Carbon nanotube tipped atomic force microscopy for measurement of <100 nm etch morphology on semiconductors” [Appl. Phys. Lett. 73, 529 (1998)]. Applied Physics Letters, 73 (10). 1448 doi:10.1063/1.122171
Plain TextNagy, G., Levy, M., Scarmozzino, R., Osgood, R. M., Dai, H., Smalley, R. E., Michaels, C. A., Sevy, E. T., Flynn, G. W., McLane, G. F. (1998) Erratum: “Carbon nanotube tipped atomic force microscopy for measurement of
In(1998, September) Applied Physics Letters Vol. 73 (10) AIP Publishing

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Nagy, G., Levy, M., Scarmozzino, R., Osgood, R. M., Dai, H., Smalley, R. E., Michaels, C. A., Flynn, G. W., McLane, G. F. (1998) Carbon nanotube tipped atomic force microscopy for measurement of <100 nm etch morphology on semiconductors. Applied Physics Letters, 73 (4). 529-531 doi:10.1063/1.122069
Levy, M., Scarmozzino, R., Osgood, R. M., Wolfe, R., Cadieu, F. J., Hegde, H., Gutierrez, C. J., Prinz, G. A. (1995) Erratum: ‘‘Permanent magnet film magneto‐optic waveguide isolator’’ [J. Appl. Phys. 75, 6286 (1994)]. Journal of Applied Physics, 77 (3). 1333 doi:10.1063/1.359611
Freiler, M., McLane, G. F., Kim, S., Levy, M., Scarmozzino, R., Herman, I. P., Osgood, R. M. (1995) Luminescence properties of submicron features fabricated by using magnetron reactive ion etching with different sample biases. Applied Physics Letters, 67 (26). 3883-3885 doi:10.1063/1.115305
Levy, M., Scarmozzino, R., Osgood, R. M., Wolfe, R., Cadieu, F. J., Hegde, H., Gutierrez, C. J., Prinz, G. A. (1994) Permanent magnet film magneto‐optic waveguide isolator. Journal of Applied Physics, 75 (10). 6286-6288 doi:10.1063/1.355426
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Chao, L.-L., Cargill, G. S., Levy, M., Osgood, R. M., McLane, G. F. (1997) Erratum: “Cathodoluminescence study of GaAs quantum wells and of submicron dots fabricated by magnetron reactive ion etching” [Appl. Phys. Lett. 70, 408 (1997)]. Applied Physics Letters, 71 (4). 558 doi:10.1063/1.120559
Cacouris, T., Scelsi, G., Shaw, P., Scarmozzino, R., Osgood, R. M., Krchnavek, R. R. (1988) Laser direct writing of aluminum conductors. Applied Physics Letters, 52 (22). 1865-1867 doi:10.1063/1.99609
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