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Morelhão, S. L., Avanci, L. H., Hayashi, M. A., Cardoso, L. P., Collins, S. P. (1998) Observation of coherent hybrid reflection with synchrotron radiation. Applied Physics Letters, 73 (15). 2194-2196 doi:10.1063/1.122420

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Reference TypeJournal (article/letter/editorial)
TitleObservation of coherent hybrid reflection with synchrotron radiation
JournalApplied Physics Letters
AuthorsMorelhão, S. L.Author
Avanci, L. H.Author
Hayashi, M. A.Author
Cardoso, L. P.Author
Collins, S. P.Author
Year1998 (October 12)Volume73
Issue15
PublisherAIP Publishing
DOIdoi:10.1063/1.122420Search in ResearchGate
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Mindat Ref. ID8522030Long-form Identifiermindat:1:5:8522030:4
GUID0
Full ReferenceMorelhão, S. L., Avanci, L. H., Hayashi, M. A., Cardoso, L. P., Collins, S. P. (1998) Observation of coherent hybrid reflection with synchrotron radiation. Applied Physics Letters, 73 (15). 2194-2196 doi:10.1063/1.122420
Plain TextMorelhão, S. L., Avanci, L. H., Hayashi, M. A., Cardoso, L. P., Collins, S. P. (1998) Observation of coherent hybrid reflection with synchrotron radiation. Applied Physics Letters, 73 (15). 2194-2196 doi:10.1063/1.122420
In(1998, October) Applied Physics Letters Vol. 73 (15) AIP Publishing

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Hayashi, M. A., Avanci, L. H., Cardoso, L. P., Bettini, J., de Carvalho, M. M. G., Morelhão, S. L., Collins, S. P. (1999) High-resolution synchrotron radiation Renninger scan to examine hybrid reflections in InGaP/GaAs(001). Journal of Synchrotron Radiation, 6 (1). 29-33 doi:10.1107/s0909049598012953
Hayashi, M. A., Morelhão, S. L., Avanci, L. H., Cardoso, L. P., Sasaki, J. M., Kretly, L. C., Chang, S. L. (1997) Sensitivity of Bragg surface diffraction to analyze ion-implanted semiconductors. Applied Physics Letters, 71 (18). 2614-2616 doi:10.1063/1.120157
Morelhão, S. L., Cardoso, L. P. (1993) Structural properties of heteroepitaxial systems using hybrid multiple diffraction in Renninger scans. Journal of Applied Physics, 73 (9). 4218-4226 doi:10.1063/1.352827
Avanci, L. H., Remédios, C. M. R., Nascimento, F. C., Tabacniks, M. H., Sasaki, J. M., Cardoso, L. P., Morelhão, S. L. (2005) Substitutional and interstitial inclusions of Mn additivies onto the KDP lattice. Acta Crystallographica Section A Foundations of Crystallography, 61. doi:10.1107/s0108767305081353
Morelhão, S. L., Cardoso, L. P., Sasaki, J. M., de Carvalho, M. M. G. (1991) Hybrid multiple diffraction in Renninger scan for heteroepitaxial layers. Journal of Applied Physics, 70 (5). 2589-2593 doi:10.1063/1.349367
Avanci, L. H., Cardoso, L. P., Girdwood, S. E., Pugh, D., Sherwood, J. N., Roberts, K. J. (1998) Piezoelectric Coefficients of mNA Organic Nonlinear Optical Material Using Synchrotron X-Ray Multiple Diffraction. Physical Review Letters, 81 (24). 5426-5429 doi:10.1103/physrevlett.81.5426
Montgomery, J. S., Schneider, T. P., Carter, R. J., Barnak, J. P., Chen, Y. L., Hauser, J. R., Nemanich, R. J. (1995) Morphology of Si(100) surfaces exposed to a remote H plasma. Applied Physics Letters, 67 (15). 2194-2196 doi:10.1063/1.115100
Morelhão, S. L., Avanci, L. H., Quivy, A. A., Abramof, E. (2002) Two-dimensional intensity profiles of effective satellites. Journal of Applied Crystallography, 35 (1). 69-74 doi:10.1107/s0021889801018921
Avanci, L. H., Morelhão, S. L. (2000) Bragg-surface dynamical diffraction. Acta Crystallographica Section A Foundations of Crystallography, 56 (5). 507-508 doi:10.1107/s0108767300009077
Avanci, L. H., Cardoso, L. P., Sasaki, J. M., Girdwood, S. E., Roberts, K. J., Pugh, D., Sherwood, J. N. (2000) Synchrotron-radiation x-ray multiple diffraction applied to the study of electric-field-induced strain in an organic nonlinear optical material. Physical Review B, 61 (10) 6507-6514 doi:10.1103/physrevb.61.6507
de Menezes, Alan S., dos Santos, Adenilson O., Almeida, Juliana M. A., Bortoleto, José R. R., Cotta, Mônica A., Morelhão, Sérgio L., Cardoso, Lisandro P. (2009) Hybrid reflections in InGaP/GaAs(001) by synchrotron radiation multiple diffraction. physica status solidi (b), 246 (3). 544-547 doi:10.1002/pssb.200880543
 
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