Reference Type | Journal (article/letter/editorial) |
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Title | Raman imaging of patterned silicon using a solid immersion lens |
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Journal | Applied Physics Letters |
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Authors | Poweleit, C. D. | Author |
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Gunther, A. | Author |
Goodnick, S. | Author |
Menéndez, José | Author |
Year | 1998 (October 19) | Volume | 73 |
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Issue | 16 |
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Publisher | AIP Publishing |
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DOI | doi:10.1063/1.121700Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 8522070 | Long-form Identifier | mindat:1:5:8522070:2 |
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GUID | 0 |
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Full Reference | Poweleit, C. D., Gunther, A., Goodnick, S., Menéndez, José (1998) Raman imaging of patterned silicon using a solid immersion lens. Applied Physics Letters, 73 (16). 2275-2277 doi:10.1063/1.121700 |
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Plain Text | Poweleit, C. D., Gunther, A., Goodnick, S., Menéndez, José (1998) Raman imaging of patterned silicon using a solid immersion lens. Applied Physics Letters, 73 (16). 2275-2277 doi:10.1063/1.121700 |
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In | (1998, October) Applied Physics Letters Vol. 73 (16) AIP Publishing |
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