Reference Type | Journal (article/letter/editorial) |
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Title | Characterization of hydrogen-terminated Si(111) surfaces by sum-frequency surface vibrational spectroscopy |
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Journal | Applied Physics Letters |
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Authors | Mao, M. Y. | Author |
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Miranda, P. B. | Author |
Kim, D. S. | Author |
Shen, Y. R. | Author |
Year | 1999 (November 22) | Volume | 75 |
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Issue | 21 |
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Publisher | AIP Publishing |
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DOI | doi:10.1063/1.125350Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 8525082 | Long-form Identifier | mindat:1:5:8525082:8 |
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GUID | 0 |
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Full Reference | Mao, M. Y., Miranda, P. B., Kim, D. S., Shen, Y. R. (1999) Characterization of hydrogen-terminated Si(111) surfaces by sum-frequency surface vibrational spectroscopy. Applied Physics Letters, 75 (21). 3357-3359 doi:10.1063/1.125350 |
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Plain Text | Mao, M. Y., Miranda, P. B., Kim, D. S., Shen, Y. R. (1999) Characterization of hydrogen-terminated Si(111) surfaces by sum-frequency surface vibrational spectroscopy. Applied Physics Letters, 75 (21). 3357-3359 doi:10.1063/1.125350 |
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In | (1999, November) Applied Physics Letters Vol. 75 (21) AIP Publishing |
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