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von Freymann, G., Kurtz, E., Klingshirn, C., Wegener, M. (2000) Statistical analysis of near-field photoluminescence spectra of single ultrathin layers of CdSe/ZnSe. Applied Physics Letters, 77 (3). 394-396 doi:10.1063/1.126987

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Reference TypeJournal (article/letter/editorial)
TitleStatistical analysis of near-field photoluminescence spectra of single ultrathin layers of CdSe/ZnSe
JournalApplied Physics Letters
Authorsvon Freymann, G.Author
Kurtz, E.Author
Klingshirn, C.Author
Wegener, M.Author
Year2000 (July 17)Volume77
Issue3
PublisherAIP Publishing
DOIdoi:10.1063/1.126987Search in ResearchGate
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Mindat Ref. ID8528076Long-form Identifiermindat:1:5:8528076:8
GUID0
Full Referencevon Freymann, G., Kurtz, E., Klingshirn, C., Wegener, M. (2000) Statistical analysis of near-field photoluminescence spectra of single ultrathin layers of CdSe/ZnSe. Applied Physics Letters, 77 (3). 394-396 doi:10.1063/1.126987
Plain Textvon Freymann, G., Kurtz, E., Klingshirn, C., Wegener, M. (2000) Statistical analysis of near-field photoluminescence spectra of single ultrathin layers of CdSe/ZnSe. Applied Physics Letters, 77 (3). 394-396 doi:10.1063/1.126987
In(2000, July) Applied Physics Letters Vol. 77 (3) AIP Publishing


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