von Freymann, G., Kurtz, E., Klingshirn, C., Wegener, M. (2000) Statistical analysis of near-field photoluminescence spectra of single ultrathin layers of CdSe/ZnSe. Applied Physics Letters, 77 (3). 394-396 doi:10.1063/1.126987
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Statistical analysis of near-field photoluminescence spectra of single ultrathin layers of CdSe/ZnSe | ||
Journal | Applied Physics Letters | ||
Authors | von Freymann, G. | Author | |
Kurtz, E. | Author | ||
Klingshirn, C. | Author | ||
Wegener, M. | Author | ||
Year | 2000 (July 17) | Volume | 77 |
Issue | 3 | ||
Publisher | AIP Publishing | ||
DOI | doi:10.1063/1.126987Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 8528076 | Long-form Identifier | mindat:1:5:8528076:8 |
GUID | 0 | ||
Full Reference | von Freymann, G., Kurtz, E., Klingshirn, C., Wegener, M. (2000) Statistical analysis of near-field photoluminescence spectra of single ultrathin layers of CdSe/ZnSe. Applied Physics Letters, 77 (3). 394-396 doi:10.1063/1.126987 | ||
Plain Text | von Freymann, G., Kurtz, E., Klingshirn, C., Wegener, M. (2000) Statistical analysis of near-field photoluminescence spectra of single ultrathin layers of CdSe/ZnSe. Applied Physics Letters, 77 (3). 394-396 doi:10.1063/1.126987 | ||
In | (2000, July) Applied Physics Letters Vol. 77 (3) AIP Publishing |
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