Reference Type | Journal (article/letter/editorial) |
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Title | F-enhanced morphological and thermal stability of NiSi films on BF2+-implanted Si(001) |
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Journal | Applied Physics Letters |
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Authors | Wong, A. S. W. | Author |
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Chi, D. Z. | Author |
Loomans, M. | Author |
Ma, D. | Author |
Lai, M. Y. | Author |
Tjiu, W. C. | Author |
Chua, S. J. | Author |
Lim, C. W. | Author |
Greene, J. E. | Author |
Year | 2002 (December 30) | Volume | 81 |
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Issue | 27 |
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Publisher | AIP Publishing |
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DOI | doi:10.1063/1.1533856Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 8534077 | Long-form Identifier | mindat:1:5:8534077:8 |
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GUID | 0 |
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Full Reference | Wong, A. S. W., Chi, D. Z., Loomans, M., Ma, D., Lai, M. Y., Tjiu, W. C., Chua, S. J., Lim, C. W., Greene, J. E. (2002) F-enhanced morphological and thermal stability of NiSi films on BF2+-implanted Si(001). Applied Physics Letters, 81 (27). 5138-5140 doi:10.1063/1.1533856 |
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Plain Text | Wong, A. S. W., Chi, D. Z., Loomans, M., Ma, D., Lai, M. Y., Tjiu, W. C., Chua, S. J., Lim, C. W., Greene, J. E. (2002) F-enhanced morphological and thermal stability of NiSi films on BF2+-implanted Si(001). Applied Physics Letters, 81 (27). 5138-5140 doi:10.1063/1.1533856 |
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In | (2002, December) Applied Physics Letters Vol. 81 (27) AIP Publishing |
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