Razumov, S. V., Tumarkin, A. V., Gaidukov, M. M., Gagarin, A. G., Kozyrev, A. B., Vendik, O. G., Ivanov, A. V., Buslov, O. U., Keys, V. N., Sengupta, L. C., Zhang, X. (2002) Characterization of quality of BaxSr1−xTiO3 thin film by the commutation quality factor measured at microwaves. Applied Physics Letters, 81 (9). 1675-1677 doi:10.1063/1.1499987
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Characterization of quality of BaxSr1−xTiO3 thin film by the commutation quality factor measured at microwaves | ||
Journal | Applied Physics Letters | ||
Authors | Razumov, S. V. | Author | |
Tumarkin, A. V. | Author | ||
Gaidukov, M. M. | Author | ||
Gagarin, A. G. | Author | ||
Kozyrev, A. B. | Author | ||
Vendik, O. G. | Author | ||
Ivanov, A. V. | Author | ||
Buslov, O. U. | Author | ||
Keys, V. N. | Author | ||
Sengupta, L. C. | Author | ||
Zhang, X. | Author | ||
Year | 2002 (August 26) | Volume | 81 |
Issue | 9 | ||
Publisher | AIP Publishing | ||
DOI | doi:10.1063/1.1499987Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 8534480 | Long-form Identifier | mindat:1:5:8534480:8 |
GUID | 0 | ||
Full Reference | Razumov, S. V., Tumarkin, A. V., Gaidukov, M. M., Gagarin, A. G., Kozyrev, A. B., Vendik, O. G., Ivanov, A. V., Buslov, O. U., Keys, V. N., Sengupta, L. C., Zhang, X. (2002) Characterization of quality of BaxSr1−xTiO3 thin film by the commutation quality factor measured at microwaves. Applied Physics Letters, 81 (9). 1675-1677 doi:10.1063/1.1499987 | ||
Plain Text | Razumov, S. V., Tumarkin, A. V., Gaidukov, M. M., Gagarin, A. G., Kozyrev, A. B., Vendik, O. G., Ivanov, A. V., Buslov, O. U., Keys, V. N., Sengupta, L. C., Zhang, X. (2002) Characterization of quality of BaxSr1−xTiO3 thin film by the commutation quality factor measured at microwaves. Applied Physics Letters, 81 (9). 1675-1677 doi:10.1063/1.1499987 | ||
In | (2002, August) Applied Physics Letters Vol. 81 (9) AIP Publishing |
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