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Hyun, S., Vinci, R. P., Fahey, K. P., Clemens, B. M. (2003) Effect of grain structure on the onset of diffusion-controlled stress relaxation in Pt thin films. Applied Physics Letters, 83 (14). 2769-2771 doi:10.1063/1.1615311

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Reference TypeJournal (article/letter/editorial)
TitleEffect of grain structure on the onset of diffusion-controlled stress relaxation in Pt thin films
JournalApplied Physics Letters
AuthorsHyun, S.Author
Vinci, R. P.Author
Fahey, K. P.Author
Clemens, B. M.Author
Year2003 (October 6)Volume83
Issue14
PublisherAIP Publishing
DOIdoi:10.1063/1.1615311Search in ResearchGate
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Mindat Ref. ID8536467Long-form Identifiermindat:1:5:8536467:1
GUID0
Full ReferenceHyun, S., Vinci, R. P., Fahey, K. P., Clemens, B. M. (2003) Effect of grain structure on the onset of diffusion-controlled stress relaxation in Pt thin films. Applied Physics Letters, 83 (14). 2769-2771 doi:10.1063/1.1615311
Plain TextHyun, S., Vinci, R. P., Fahey, K. P., Clemens, B. M. (2003) Effect of grain structure on the onset of diffusion-controlled stress relaxation in Pt thin films. Applied Physics Letters, 83 (14). 2769-2771 doi:10.1063/1.1615311
In(2003, October) Applied Physics Letters Vol. 83 (14) AIP Publishing

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Zielinski, E. M., Vinci, R. P., Bravman, J. C. (1995) The influence of strain energy on abnormal grain growth in copper thin films. Applied Physics Letters, 67 (8). 1078-1080 doi:10.1063/1.114455
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Hyun, Seungmin, Hooghan, Tejpal K., Brown, Walter L., Vinci, Richard P. (2005) Linear viscoelasticity in aluminum thin films. Applied Physics Letters, 87 (6). 61902pp. doi:10.1063/1.2008383
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