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Wu, J. W., You, J. W., Ma, H. C., Cheng, C. C., Chang, C. S., Huang, G. W., Wang, T. (2004) Valence-band tunneling induced low frequency noise in ultrathin oxide (15Å) n-type metal-oxide-semiconductor field effect transistors. Applied Physics Letters, 85 (21). 5076-5077 doi:10.1063/1.1827930

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Reference TypeJournal (article/letter/editorial)
TitleValence-band tunneling induced low frequency noise in ultrathin oxide (15Å) n-type metal-oxide-semiconductor field effect transistors
JournalApplied Physics Letters
AuthorsWu, J. W.Author
You, J. W.Author
Ma, H. C.Author
Cheng, C. C.Author
Chang, C. S.Author
Huang, G. W.Author
Wang, T.Author
Year2004 (November 22)Volume85
Issue21
PublisherAIP Publishing
DOIdoi:10.1063/1.1827930Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID8540892Long-form Identifiermindat:1:5:8540892:0
GUID0
Full ReferenceWu, J. W., You, J. W., Ma, H. C., Cheng, C. C., Chang, C. S., Huang, G. W., Wang, T. (2004) Valence-band tunneling induced low frequency noise in ultrathin oxide (15Å) n-type metal-oxide-semiconductor field effect transistors. Applied Physics Letters, 85 (21). 5076-5077 doi:10.1063/1.1827930
Plain TextWu, J. W., You, J. W., Ma, H. C., Cheng, C. C., Chang, C. S., Huang, G. W., Wang, T. (2004) Valence-band tunneling induced low frequency noise in ultrathin oxide (15Å) n-type metal-oxide-semiconductor field effect transistors. Applied Physics Letters, 85 (21). 5076-5077 doi:10.1063/1.1827930
In(2004, November) Applied Physics Letters Vol. 85 (21) AIP Publishing


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