Watch the Dallas Symposium LIVE, and fundraiser auction
Ticket proceeds support mindat.org! - click here...
Log InRegister
Quick Links : The Mindat ManualThe Rock H. Currier Digital LibraryMindat Newsletter [Free Download]
Home PageAbout MindatThe Mindat ManualHistory of MindatCopyright StatusWho We AreContact UsAdvertise on Mindat
Donate to MindatCorporate SponsorshipSponsor a PageSponsored PagesMindat AdvertisersAdvertise on Mindat
Learning CenterWhat is a mineral?The most common minerals on earthInformation for EducatorsMindat ArticlesThe ElementsThe Rock H. Currier Digital LibraryGeologic Time
Minerals by PropertiesMinerals by ChemistryAdvanced Locality SearchRandom MineralRandom LocalitySearch by minIDLocalities Near MeSearch ArticlesSearch GlossaryMore Search Options
Search For:
Mineral Name:
Locality Name:
Keyword(s):
 
The Mindat ManualAdd a New PhotoRate PhotosLocality Edit ReportCoordinate Completion ReportAdd Glossary Item
Mining CompaniesStatisticsUsersMineral MuseumsClubs & OrganizationsMineral Shows & EventsThe Mindat DirectoryDevice SettingsThe Mineral Quiz
Photo SearchPhoto GalleriesSearch by ColorNew Photos TodayNew Photos YesterdayMembers' Photo GalleriesPast Photo of the Day GalleryPhotography

Falke, Meiken, Falke, Uwe, Bleloch, Andrew, Teichert, Steffen, Beddies, G., Hinneberg, H.-J. (2005) Real structure of the CoSi2∕Si(001) interface studied by dedicated aberration-corrected scanning transmission electron microscopy. Applied Physics Letters, 86 (20). 203103pp. doi:10.1063/1.1927692

Advanced
   -   Only viewable:
Reference TypeJournal (article/letter/editorial)
TitleReal structure of the CoSi2∕Si(001) interface studied by dedicated aberration-corrected scanning transmission electron microscopy
JournalApplied Physics Letters
AuthorsFalke, MeikenAuthor
Falke, UweAuthor
Bleloch, AndrewAuthor
Teichert, SteffenAuthor
Beddies, G.Author
Hinneberg, H.-J.Author
Year2005 (May 16)Volume86
Issue20
PublisherAIP Publishing
DOIdoi:10.1063/1.1927692Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID8542918Long-form Identifiermindat:1:5:8542918:1
GUID0
Full ReferenceFalke, Meiken, Falke, Uwe, Bleloch, Andrew, Teichert, Steffen, Beddies, G., Hinneberg, H.-J. (2005) Real structure of the CoSi2∕Si(001) interface studied by dedicated aberration-corrected scanning transmission electron microscopy. Applied Physics Letters, 86 (20). 203103pp. doi:10.1063/1.1927692
Plain TextFalke, Meiken, Falke, Uwe, Bleloch, Andrew, Teichert, Steffen, Beddies, G., Hinneberg, H.-J. (2005) Real structure of the CoSi2∕Si(001) interface studied by dedicated aberration-corrected scanning transmission electron microscopy. Applied Physics Letters, 86 (20). 203103pp. doi:10.1063/1.1927692
In(2005, May) Applied Physics Letters Vol. 86 (20) AIP Publishing

See Also

These are possibly similar items as determined by title/reference text matching only.

Falke, Meiken, Falke, Uwe, Bleloch, Andrew (2006) Misfit dislocations at the CoSi2/Si (001) interface studied by aberration-corrected high angle annular darkfield imaging. Journal of Physics: Conference Series, 26. 21-24 doi:10.1088/1742-6596/26/1/005
Falke, Uwe, Bleloch, Andrew, Falke, Meiken, Teichert, Steffen (2004) Atomic Structure of a(2×1)ReconstructedNiSi2/Si(001)Interface. Physical Review Letters, 92 (11). doi:10.1103/physrevlett.92.116103
Falke, M, Allenstein, F, Beddies, G, Schulze, S, Hietschold, M, Falke, U, Bleloch, A (2007) The Interface of Epitaxial Cubic Silicide Films with Modified Lattice Parameter on Si(001) Investigated by Aberration Corrected Dedicated STEM. Microscopy and Microanalysis, 13. doi:10.1017/s1431927607081974
Mogilatenko, A., Falke, M., Teichert, S., Beddies, G., Hinneberg, H.-J. (2003) Transmission Electron Microscopy Study of Mn4Si7 Growth on (001)Si. Microscopy and Microanalysis, 9. 260-261 doi:10.1017/s1431927603023183
Sarkar, D. K., Rau, I., Falke, M., Giesler, H., Teichert, S., Beddies, G., Hinneberg, H.-J. (2001) Structure, interface roughness, and growth mechanism of reactive deposition epitaxy of CoSi2 on Si(100) substrates. Applied Physics Letters, 78 (23). 3604-3606 doi:10.1063/1.1377620
Falke, U., Falke, M., Bleloch, A. (2003) Nickel Disilicide/Silicon(001) Interface Structure revealed by HAADF in an Aberration corrected dedicated STEM. Microscopy and Microanalysis, 9. 288-289 doi:10.1017/s1431927603024048
Mogilatenko, Anna, Falke, Meiken, Hortenbach, Heiko, Teichert, Steffen, Beddies, Gunter, Hinneberg, Hans-Jürgen (2005) Passivation of Si(001) by the surfactant Sb and its influence on the NiSi2 growth. Journal of Crystal Growth, 283 (3). 303-308 doi:10.1016/j.jcrysgro.2005.06.029
Wang, P., Bleloch, A. L., Falke, M., Goodhew, P. J., Ng, J., Missous, M. (2006) Direct measurement of composition of buried quantum dots using aberration-corrected scanning transmission electron microscopy. Applied Physics Letters, 89 (7). 72111pp. doi:10.1063/1.2335361
Bleloch, Andrew L, Falke, Uwe, Falke, Meiken (2004) Simultaneous Imaging and EELS with 0.1nm and 0.35eV. Microscopy and Microanalysis, 10. 846-847 doi:10.1017/s1431927604882527
Beddies, G., Falke, M., Teichert, S., Gebhardt, B., Hinneberg, H.-J. (1999) Reactive ion etching of CoSi2 in a CF4/Ar plasma. Applied Surface Science, 138. 370-375 doi:10.1016/s0169-4332(98)00429-2
Teichert, S, Schwendler, S, Sarkar, D.K, Mogilatenko, A, Falke, M, Beddies, G, Kleint, C, Hinneberg, H.-J (2001) Growth of MnSi1.7 on Si(001) by MBE. Journal of Crystal Growth, 227. 882-887 doi:10.1016/s0022-0248(01)00922-8
 
and/or  
Mindat.org is an outreach project of the Hudson Institute of Mineralogy, a 501(c)(3) not-for-profit organization.
Copyright © mindat.org and the Hudson Institute of Mineralogy 1993-2025, except where stated. Most political location boundaries are © OpenStreetMap contributors. Mindat.org relies on the contributions of thousands of members and supporters. Founded in 2000 by Jolyon Ralph.
To cite: Ralph, J., Von Bargen, D., Martynov, P., Zhang, J., Que, X., Prabhu, A., Morrison, S. M., Li, W., Chen, W., & Ma, X. (2025). Mindat.org: The open access mineralogy database to accelerate data-intensive geoscience research. American Mineralogist, 110(6), 833–844. doi:10.2138/am-2024-9486.
Privacy Policy - Terms & Conditions - Contact Us / DMCA issues - Report a bug/vulnerability Current server date and time: August 20, 2025 15:52:08
Go to top of page