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Plonka, R., Dittmann, R., Pertsev, N. A., Vasco, E., Waser, R. (2005) Impact of the top-electrode material on the permittivity of single-crystalline Ba0.7Sr0.3TiO3 thin films. Applied Physics Letters, 86 (20). 202908pp. doi:10.1063/1.1931063

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Reference TypeJournal (article/letter/editorial)
TitleImpact of the top-electrode material on the permittivity of single-crystalline Ba0.7Sr0.3TiO3 thin films
JournalApplied Physics Letters
AuthorsPlonka, R.Author
Dittmann, R.Author
Pertsev, N. A.Author
Vasco, E.Author
Waser, R.Author
Year2005 (May 16)Volume86
Issue20
PublisherAIP Publishing
DOIdoi:10.1063/1.1931063Search in ResearchGate
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Mindat Ref. ID8542964Long-form Identifiermindat:1:5:8542964:0
GUID0
Full ReferencePlonka, R., Dittmann, R., Pertsev, N. A., Vasco, E., Waser, R. (2005) Impact of the top-electrode material on the permittivity of single-crystalline Ba0.7Sr0.3TiO3 thin films. Applied Physics Letters, 86 (20). 202908pp. doi:10.1063/1.1931063
Plain TextPlonka, R., Dittmann, R., Pertsev, N. A., Vasco, E., Waser, R. (2005) Impact of the top-electrode material on the permittivity of single-crystalline Ba0.7Sr0.3TiO3 thin films. Applied Physics Letters, 86 (20). 202908pp. doi:10.1063/1.1931063
In(2005, May) Applied Physics Letters Vol. 86 (20) AIP Publishing

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Dittmann, R., Plonka, R., Vasco, E., Pertsev, N. A., He, J. Q., Jia, C. L., Hoffmann-Eifert, S., Waser, R. (2003) Sharp ferroelectric phase transition in strained single-crystalline SrRuO3/Ba0.7Sr0.3TiO3/SrRuO3 capacitors. Applied Physics Letters, 83 (24). 5011-5013 doi:10.1063/1.1633027
Pertsev, N. A., Dittmann, R., Plonka, R., Waser, R. (2007) Thickness dependence of intrinsic dielectric response and apparent interfacial capacitance in ferroelectric thin films. Journal of Applied Physics, 101 (7). 74102pp. doi:10.1063/1.2713934
He, J. Q., Vasco, E., Jia, C. L., Dittmann, R., Wang, R. H. (2005) Microstructure of epitaxial Ba0.7Sr0.3TiO3∕SrRuO3 bilayer films on SrTiO3 substrates. Journal of Applied Physics, 97 (10). 104907pp. doi:10.1063/1.1897067
Zembilgotov, A. G., Pertsev, N. A., Böttger, U., Waser, R. (2005) Effect of anisotropic in-plane strains on phase states and dielectric properties of epitaxial ferroelectric thin films. Applied Physics Letters, 86 (5). 52903pp. doi:10.1063/1.1855389
Vasco, E., Dittmann, R., Karthäuser, S., Waser, R. (2003) Early self-assembled stages in epitaxial SrRuO3 on LaAlO3. Applied Physics Letters, 82 (15). 2497-2499 doi:10.1063/1.1566798
Meyer, R., Liedtke, R., Waser, R. (2005) Oxygen vacancy migration and time-dependent leakage current behavior of Ba0.3Sr0.7TiO3 thin films. Applied Physics Letters, 86 (11). 112904pp. doi:10.1063/1.1874313
Oligschlaeger, R., Waser, R., Meyer, R., Karthäuser, S., Dittmann, R. (2006) Resistive switching and data reliability of epitaxial (Ba,Sr)TiO3 thin films. Applied Physics Letters, 88 (4). 42901pp. doi:10.1063/1.2162860
Pertsev, N. A., Koukhar, V. G., Waser, R., Hoffmann, S. (2000) Curie–Weiss-type law for the strain and stress effects on the dielectric response of ferroelectric thin films. Applied Physics Letters, 77 (16). 2596-2598 doi:10.1063/1.1318934
Shen, Wan, Dittmann, Regina, Breuer, Uwe, Waser, Rainer (2008) Improved endurance behavior of resistive switching in (Ba,Sr)TiO3 thin films with W top electrode. Applied Physics Letters, 93 (22). 222102pp. doi:10.1063/1.3039809
Koukhar, V. G., Pertsev, N. A., Waser, R. (2001) In-plane polarization states and their instabilities in polydomain epitaxial ferroelectric thin films. Applied Physics Letters, 78 (4). 530-532 doi:10.1063/1.1338960
Roelofs, A., Pertsev, N. A., Waser, R., Schlaphof, F., Eng, L. M., Ganpule, C., Nagarajan, V., Ramesh, R. (2002) Depolarizing-field-mediated 180° switching in ferroelectric thin films with 90° domains. Applied Physics Letters, 80 (8). 1424-1426 doi:10.1063/1.1448653
 
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