Chan, Paddy K. L., Pipe, Kevin P., Qin, Guoxuan, Ma, Zhenqiang (2006) Thermoreflectance imaging of current dynamics in high power SiGe heterojunction bipolar transistors. Applied Physics Letters, 89 (23). 233521pp. doi:10.1063/1.2402947
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Thermoreflectance imaging of current dynamics in high power SiGe heterojunction bipolar transistors | ||
Journal | Applied Physics Letters | ||
Authors | Chan, Paddy K. L. | Author | |
Pipe, Kevin P. | Author | ||
Qin, Guoxuan | Author | ||
Ma, Zhenqiang | Author | ||
Year | 2006 (December 4) | Volume | 89 |
Issue | 23 | ||
Publisher | AIP Publishing | ||
DOI | doi:10.1063/1.2402947Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 8551251 | Long-form Identifier | mindat:1:5:8551251:5 |
GUID | 0 | ||
Full Reference | Chan, Paddy K. L., Pipe, Kevin P., Qin, Guoxuan, Ma, Zhenqiang (2006) Thermoreflectance imaging of current dynamics in high power SiGe heterojunction bipolar transistors. Applied Physics Letters, 89 (23). 233521pp. doi:10.1063/1.2402947 | ||
Plain Text | Chan, Paddy K. L., Pipe, Kevin P., Qin, Guoxuan, Ma, Zhenqiang (2006) Thermoreflectance imaging of current dynamics in high power SiGe heterojunction bipolar transistors. Applied Physics Letters, 89 (23). 233521pp. doi:10.1063/1.2402947 | ||
In | (2006, December) Applied Physics Letters Vol. 89 (23) AIP Publishing |
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