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Czerwinski, A., Płuska, M., Ratajczak, J., Szerling, A., Kątcki, J. (2006) Resistance and sheet resistance measurements using electron beam induced current. Applied Physics Letters, 89 (24). 241919pp. doi:10.1063/1.2405886

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Reference TypeJournal (article/letter/editorial)
TitleResistance and sheet resistance measurements using electron beam induced current
JournalApplied Physics Letters
AuthorsCzerwinski, A.Author
Płuska, M.Author
Ratajczak, J.Author
Szerling, A.Author
Kątcki, J.Author
Year2006 (December 11)Volume89
Issue24
PublisherAIP Publishing
DOIdoi:10.1063/1.2405886Search in ResearchGate
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Mindat Ref. ID8551410Long-form Identifiermindat:1:5:8551410:6
GUID0
Full ReferenceCzerwinski, A., Płuska, M., Ratajczak, J., Szerling, A., Kątcki, J. (2006) Resistance and sheet resistance measurements using electron beam induced current. Applied Physics Letters, 89 (24). 241919pp. doi:10.1063/1.2405886
Plain TextCzerwinski, A., Płuska, M., Ratajczak, J., Szerling, A., Kątcki, J. (2006) Resistance and sheet resistance measurements using electron beam induced current. Applied Physics Letters, 89 (24). 241919pp. doi:10.1063/1.2405886
In(2006, December) Applied Physics Letters Vol. 89 (24) AIP Publishing

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Czerwinski, A., Pluska, M., Ratajczak, J., Szerling, A., Kątcki, J. (2008) Impact of resistance on cathodoluminescence and its application for layer sheet-resistance measurements. Applied Physics Letters, 93 (4). 41109pp. doi:10.1063/1.2966339
CZERWINSKI, A., PLUSKA, M., RATAJCZAK, J., SZERLING, A., KąTCKI, J. (2010) Dependence of cathodoluminescence on layer resistance applied for measurement of thin-layer sheet resistance. Journal of Microscopy, 237 (3). 304-307 doi:10.1111/j.1365-2818.2009.03248.x
Pluska, M., Czerwinski, A., Ratajczak, J., Szerling, A., Kątcki, J. (2009) Dependence of Nanoelectronic-Structure Defect Detection by Cathodoluminescence on Electron Beam Current. Acta Physica Polonica A, 116. doi:10.12693/aphyspola.116.s-86
CZERWINSKI, A., PŁUSKA, M., RATAJCZAK, J., KATCKI, J. (2006) In situ electron beam induced current measurements of the local thickness in semiconductor devices. Journal of Microscopy, 224 (1). 86-88 doi:10.1111/j.1365-2818.2006.01671.x
PŁUSKA, M., CZERWINSKI, A., RATAJCZAK, J., KĄTCKI, J., RAK, R. (2006) Elimination of scanning electron microscopy image periodic distortions with digital signal-processing methods. Journal of Microscopy, 224 (1). 89-92 doi:10.1111/j.1365-2818.2006.01672.x
Pluska, M., Czerwinski, A., Szerling, A., Ratajczak, J., Kątcki, J. (2014) Effect of Secondary Electroluminescence on Cathodoluminescence and Other Luminescence Measurements. Acta Physica Polonica A, 125 (4). 1027-1032 doi:10.12693/aphyspola.125.1027
Czerwinski, Andrzej, Pluska, Mariusz, Ratajczak, Jacek, Szerling, Anna, K\\katcki, Jerzy (2007) Layer or Strip Resistance Measurement by Electron Beam Induced Current Technique in a Scanning Electron Microscope. MATERIALS TRANSACTIONS, 48 (5). 949-953 doi:10.2320/matertrans.48.949
PŁUSKA, M., CZERWINSKI, A., RATAJCZAK, J., KĄTCKI, J., MARONA, L., CZERNECKI, R., LESZCZYŃSKI, M., PERLIN, P. (2009) New approach to cathodoluminescence studies in application to InGaN/GaN laser diode degradation. Journal of Microscopy, 236 (2). 137-142 doi:10.1111/j.1365-2818.2009.03285.x
ŁASZCZ, A., CZERWINSKI, A., RATAJCZAK, J., SZERLING, A., PHILLIPP, F., VAN AKEN, P.A., KĄTCKI, J. (2010) Transmission electron microscopy characterization of Au/Pt/Ti/Pt/GaAs ohmic contacts for high power GaAs/InGaAs semiconductor lasers. Journal of Microscopy, 237 (3). 347-351 doi:10.1111/j.1365-2818.2009.03258.x
Ratajczak, J., Kątcki, J., Maląg, A. (2003) Electron beam-induced current, cathodoluminescence and cross-sectional transmission electron microscopy characterization of degraded AlGaAs/GaAs lasers. Materials Chemistry and Physics, 81. 269-272 doi:10.1016/s0254-0584(02)00599-0
PLUSKA, M., CZERWINSKI, A., RATAJCZAK, J., KĄTCKI, J., OSKWAREK, Ł., RAK, R. (2010) Identification of electron beam vibration sources by separation of magnetic distortion from electric distortion on scanning electron microscope imaging. Journal of Microscopy, 237 (3). 325-328 doi:10.1111/j.1365-2818.2009.03252.x
 
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