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Yao, Z. Q., Ye, Q., Li, Y. Q., Zou, Y. S., Zhang, W. J., Lee, S. T. (2007) Microstructure analysis of c-axis oriented aluminum nitride thin films by high-resolution transmission electron microscopy. Applied Physics Letters, 90 (12). 121907pp. doi:10.1063/1.2715173

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Reference TypeJournal (article/letter/editorial)
TitleMicrostructure analysis of c-axis oriented aluminum nitride thin films by high-resolution transmission electron microscopy
JournalApplied Physics Letters
AuthorsYao, Z. Q.Author
Ye, Q.Author
Li, Y. Q.Author
Zou, Y. S.Author
Zhang, W. J.Author
Lee, S. T.Author
Year2007 (March 19)Volume90
Issue12
PublisherAIP Publishing
DOIdoi:10.1063/1.2715173Search in ResearchGate
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Mindat Ref. ID8553022Long-form Identifiermindat:1:5:8553022:9
GUID0
Full ReferenceYao, Z. Q., Ye, Q., Li, Y. Q., Zou, Y. S., Zhang, W. J., Lee, S. T. (2007) Microstructure analysis of c-axis oriented aluminum nitride thin films by high-resolution transmission electron microscopy. Applied Physics Letters, 90 (12). 121907pp. doi:10.1063/1.2715173
Plain TextYao, Z. Q., Ye, Q., Li, Y. Q., Zou, Y. S., Zhang, W. J., Lee, S. T. (2007) Microstructure analysis of c-axis oriented aluminum nitride thin films by high-resolution transmission electron microscopy. Applied Physics Letters, 90 (12). 121907pp. doi:10.1063/1.2715173
In(2007, March) Applied Physics Letters Vol. 90 (12) AIP Publishing

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