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Imtiaz, Atif, Baldwin, Thomas, Nembach, Hans T., Wallis, Thomas M., Kabos, Pavel (2007) Near-field microwave microscope measurements to characterize bulk material properties. Applied Physics Letters, 90 (24). 243105pp. doi:10.1063/1.2748307

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Reference TypeJournal (article/letter/editorial)
TitleNear-field microwave microscope measurements to characterize bulk material properties
JournalApplied Physics Letters
AuthorsImtiaz, AtifAuthor
Baldwin, ThomasAuthor
Nembach, Hans T.Author
Wallis, Thomas M.Author
Kabos, PavelAuthor
Year2007 (June 11)Volume90
Issue24
PublisherAIP Publishing
DOIdoi:10.1063/1.2748307Search in ResearchGate
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Mindat Ref. ID8554580Long-form Identifiermindat:1:5:8554580:5
GUID0
Full ReferenceImtiaz, Atif, Baldwin, Thomas, Nembach, Hans T., Wallis, Thomas M., Kabos, Pavel (2007) Near-field microwave microscope measurements to characterize bulk material properties. Applied Physics Letters, 90 (24). 243105pp. doi:10.1063/1.2748307
Plain TextImtiaz, Atif, Baldwin, Thomas, Nembach, Hans T., Wallis, Thomas M., Kabos, Pavel (2007) Near-field microwave microscope measurements to characterize bulk material properties. Applied Physics Letters, 90 (24). 243105pp. doi:10.1063/1.2748307
In(2007, June) Applied Physics Letters Vol. 90 (24) AIP Publishing

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Imtiaz, Atif, Wallis, Thomas M., Weber, Joel C., Coakley, Kevin J., Brubaker, Matt D., Blanchard, Paul T., Bertness, Kris A., Sanford, Norman A., Kabos, Pavel (2014) Imaging the p-n junction in a gallium nitride nanowire with a scanning microwave microscope. Applied Physics Letters, 104 (26). 263107pp. doi:10.1063/1.4886963
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Weber, J. C., Blanchard, P. T., Sanders, A. W., Imtiaz, A., Wallis, T. M., Coakley, K. J., Bertness, K. A., Kabos, P., Sanford, N. A., Bright, V. M. (2014) Gallium nitride nanowire probe for near-field scanning microwave microscopy. Applied Physics Letters, 104 (2). 23113pp. doi:10.1063/1.4861862
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