Reference Type | Journal (article/letter/editorial) |
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Title | Critical film thickness dependence on As flux in In0.27Ga0.73As∕GaAs(001) films |
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Journal | Applied Physics Letters |
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Authors | Riposan, A. | Author |
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Mirecki Millunchick, J. | Author |
Pearson, Chris | Author |
Year | 2007 (February 26) | Volume | 90 |
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Issue | 9 |
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Publisher | AIP Publishing |
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DOI | doi:10.1063/1.2476259Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 8555532 | Long-form Identifier | mindat:1:5:8555532:5 |
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GUID | 0 |
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Full Reference | Riposan, A., Mirecki Millunchick, J., Pearson, Chris (2007) Critical film thickness dependence on As flux in In0.27Ga0.73As∕GaAs(001) films. Applied Physics Letters, 90 (9). 91902pp. doi:10.1063/1.2476259 |
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Plain Text | Riposan, A., Mirecki Millunchick, J., Pearson, Chris (2007) Critical film thickness dependence on As flux in In0.27Ga0.73As∕GaAs(001) films. Applied Physics Letters, 90 (9). 91902pp. doi:10.1063/1.2476259 |
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In | (2007, February) Applied Physics Letters Vol. 90 (9) AIP Publishing |
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