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Inoue, Tomoya, Kita, Takashi, Wada, Osamu, Konno, Mitsuru, Yaguchi, Toshie, Kamino, Takeo (2008) Electron tomography of embedded semiconductor quantum dot. Applied Physics Letters, 92 (3). 31902pp. doi:10.1063/1.2837453

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Reference TypeJournal (article/letter/editorial)
TitleElectron tomography of embedded semiconductor quantum dot
JournalApplied Physics Letters
AuthorsInoue, TomoyaAuthor
Kita, TakashiAuthor
Wada, OsamuAuthor
Konno, MitsuruAuthor
Yaguchi, ToshieAuthor
Kamino, TakeoAuthor
Year2008 (January 21)Volume92
Issue3
PublisherAIP Publishing
DOIdoi:10.1063/1.2837453Search in ResearchGate
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Mindat Ref. ID8565360Long-form Identifiermindat:1:5:8565360:9
GUID0
Full ReferenceInoue, Tomoya, Kita, Takashi, Wada, Osamu, Konno, Mitsuru, Yaguchi, Toshie, Kamino, Takeo (2008) Electron tomography of embedded semiconductor quantum dot. Applied Physics Letters, 92 (3). 31902pp. doi:10.1063/1.2837453
Plain TextInoue, Tomoya, Kita, Takashi, Wada, Osamu, Konno, Mitsuru, Yaguchi, Toshie, Kamino, Takeo (2008) Electron tomography of embedded semiconductor quantum dot. Applied Physics Letters, 92 (3). 31902pp. doi:10.1063/1.2837453
In(2008, January) Applied Physics Letters Vol. 92 (3) AIP Publishing

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Kita, Takashi, Inoue, Tomoya, Wada, Osamu, Konno, Mitsuru, Yaguchi, Toshie, Kamino, Takeo (2007) Multidirectional observation of an embedded quantum dot. Applied Physics Letters, 90 (4). 41911pp. doi:10.1063/1.2436633
Kudo, Takuya, Inoue, Tomoya, Kita, Takashi, Wada, Osamu (2008) Real time analysis of self-assembled InAs/GaAs quantum dot growth by probing reflection high-energy electron diffraction chevron image. Journal of Applied Physics, 104 (7). 74305pp. doi:10.1063/1.2987469
Inoue, Tomoya, Asada, Masaki, Yasuoka, Nami, Kojima, Osamu, Kita, Takashi, Wada, Osamu (2010) Polarization control of electroluminescence from vertically stacked InAs/GaAs quantum dots. Applied Physics Letters, 96 (21). 211906pp. doi:10.1063/1.3441403
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Yaguchi, Toshie, Konno, Mitsuru, Kamino, Takeo, Hashimoto, Takahito, Ohnishi, Tsuyoshi, Watanabe, Masashi (2004) 3D Elemental Mapping Using a Dedicated FIB/STEM System. Microscopy and Microanalysis, 10. 1030-1031 doi:10.1017/s1431927604881856
Yaguchi, Toshie, Konno, Mitsuru, Kamino, Takeo, Hashimoto, Takahito, Ohnishi, Tsuyoshi (2006) Pillar-shaped Sample Preparation Using an FIB Micro-sampling Technique and Its 3 Dimensional Elemental Analysis. Materia Japan, 45 (12). 878 doi:10.2320/materia.45.878
Yaguchi, Toshie, Konno, Mitsuru, Kamino, Takeo, Watanabe, Masashi (2008) Observation of three-dimensional elemental distributions of a Si device using a 360°-tilt FIB and the cold field-emission STEM system. Ultramicroscopy, 108 (12). 1603-1615 doi:10.1016/j.ultramic.2008.06.003
Inoue, Tomoya, Kido, Satoshi, Sasayama, Kengo, Kita, Takashi, Wada, Osamu (2010) Impurity doping in self-assembled InAs/GaAs quantum dots by selection of growth steps. Journal of Applied Physics, 108 (6). 63524pp. doi:10.1063/1.3483252
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