Thomas, John Meurig (2005) A Revolution in Electron Microscopy. Angewandte Chemie International Edition, 44 (35). 5563-5566 doi:10.1002/anie.200501466
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | A Revolution in Electron Microscopy | ||
Journal | Angewandte Chemie International Edition | ||
Authors | Thomas, John Meurig | Author | |
Year | 2005 (September 5) | Volume | 44 |
Issue | 35 | ||
Publisher | Wiley | ||
DOI | doi:10.1002/anie.200501466Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 8574108 | Long-form Identifier | mindat:1:5:8574108:3 |
GUID | 0 | ||
Full Reference | Thomas, John Meurig (2005) A Revolution in Electron Microscopy. Angewandte Chemie International Edition, 44 (35). 5563-5566 doi:10.1002/anie.200501466 | ||
Plain Text | Thomas, John Meurig (2005) A Revolution in Electron Microscopy. Angewandte Chemie International Edition, 44 (35). 5563-5566 doi:10.1002/anie.200501466 | ||
In | (2005, September) Angewandte Chemie International Edition Vol. 44 (35) Wiley |
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