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Singh, Rajeev, Bian, Zhixi, Shakouri, Ali, Zeng, Gehong, Bahk, Je-Hyeong, Bowers, John E., Zide, Joshua M. O., Gossard, Arthur C. (2009) Direct measurement of thin-film thermoelectric figure of merit. Applied Physics Letters, 94 (21). 212508pp. doi:10.1063/1.3094880

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Reference TypeJournal (article/letter/editorial)
TitleDirect measurement of thin-film thermoelectric figure of merit
JournalApplied Physics Letters
AuthorsSingh, RajeevAuthor
Bian, ZhixiAuthor
Shakouri, AliAuthor
Zeng, GehongAuthor
Bahk, Je-HyeongAuthor
Bowers, John E.Author
Zide, Joshua M. O.Author
Gossard, Arthur C.Author
Year2009 (May 25)Volume94
Issue21
PublisherAIP Publishing
DOIdoi:10.1063/1.3094880Search in ResearchGate
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Mindat Ref. ID8574332Long-form Identifiermindat:1:5:8574332:8
GUID0
Full ReferenceSingh, Rajeev, Bian, Zhixi, Shakouri, Ali, Zeng, Gehong, Bahk, Je-Hyeong, Bowers, John E., Zide, Joshua M. O., Gossard, Arthur C. (2009) Direct measurement of thin-film thermoelectric figure of merit. Applied Physics Letters, 94 (21). 212508pp. doi:10.1063/1.3094880
Plain TextSingh, Rajeev, Bian, Zhixi, Shakouri, Ali, Zeng, Gehong, Bahk, Je-Hyeong, Bowers, John E., Zide, Joshua M. O., Gossard, Arthur C. (2009) Direct measurement of thin-film thermoelectric figure of merit. Applied Physics Letters, 94 (21). 212508pp. doi:10.1063/1.3094880
In(2009, May) Applied Physics Letters Vol. 94 (21) AIP Publishing

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