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Xu, Yang, Aluru, N. R. (2009) Pull-in/out analysis of nano/microelectromechanical switches with defective oxide layers. Applied Physics Letters, 95 (7). 73112pp. doi:10.1063/1.3211111

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Reference TypeJournal (article/letter/editorial)
TitlePull-in/out analysis of nano/microelectromechanical switches with defective oxide layers
JournalApplied Physics Letters
AuthorsXu, YangAuthor
Aluru, N. R.Author
Year2009 (August 17)Volume95
Issue7
PublisherAIP Publishing
DOIdoi:10.1063/1.3211111Search in ResearchGate
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Mindat Ref. ID8581197Long-form Identifiermindat:1:5:8581197:5
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Full ReferenceXu, Yang, Aluru, N. R. (2009) Pull-in/out analysis of nano/microelectromechanical switches with defective oxide layers. Applied Physics Letters, 95 (7). 73112pp. doi:10.1063/1.3211111
Plain TextXu, Yang, Aluru, N. R. (2009) Pull-in/out analysis of nano/microelectromechanical switches with defective oxide layers. Applied Physics Letters, 95 (7). 73112pp. doi:10.1063/1.3211111
In(2009, August) Applied Physics Letters Vol. 95 (7) AIP Publishing

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