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Dubslaff, M., Hanke, M., Schöder, S., Burghammer, M., Boeck, T., Patommel, J. (2010) X-ray nanodiffraction at individual SiGe/Si(001) dot molecules and its numerical description based on kinematical scattering theory. Applied Physics Letters, 96 (13). 133107pp. doi:10.1063/1.3373916

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Reference TypeJournal (article/letter/editorial)
TitleX-ray nanodiffraction at individual SiGe/Si(001) dot molecules and its numerical description based on kinematical scattering theory
JournalApplied Physics Letters
AuthorsDubslaff, M.Author
Hanke, M.Author
Schöder, S.Author
Burghammer, M.Author
Boeck, T.Author
Patommel, J.Author
Year2010 (March 29)Volume96
Issue13
PublisherAIP Publishing
DOIdoi:10.1063/1.3373916Search in ResearchGate
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Mindat Ref. ID8582408Long-form Identifiermindat:1:5:8582408:5
GUID0
Full ReferenceDubslaff, M., Hanke, M., Schöder, S., Burghammer, M., Boeck, T., Patommel, J. (2010) X-ray nanodiffraction at individual SiGe/Si(001) dot molecules and its numerical description based on kinematical scattering theory. Applied Physics Letters, 96 (13). 133107pp. doi:10.1063/1.3373916
Plain TextDubslaff, M., Hanke, M., Schöder, S., Burghammer, M., Boeck, T., Patommel, J. (2010) X-ray nanodiffraction at individual SiGe/Si(001) dot molecules and its numerical description based on kinematical scattering theory. Applied Physics Letters, 96 (13). 133107pp. doi:10.1063/1.3373916
In(2010, March) Applied Physics Letters Vol. 96 (13) AIP Publishing

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Hanke, M., Dubslaff, M., Schmidbauer, M., Boeck, T., Schöder, S., Burghammer, M., Riekel, C., Patommel, J., Schroer, C. G. (2008) Scanning x-ray diffraction with 200nm spatial resolution. Applied Physics Letters, 92 (19). 193109pp. doi:10.1063/1.2929374
Dubslaff, M., Hanke, M., Burghammer, M., Schöder, S., Hoppe, R., Schroer, C. G., Mazur, Yu. I., Wang, Zh. M., Lee, J. H., Salamo, G. J. (2011) In(Ga)As/GaAs(001) quantum dot molecules probed by nanofocus high resolution x-ray diffraction with 100 nm resolution. Applied Physics Letters, 98 (21). 213105pp. doi:10.1063/1.3593960
Hanke, M., Boeck, T., Gerlitzke, A.-K. (2006) Template-based assembling of SiGe∕Si(001) islands by local anodic oxidation. Applied Physics Letters, 88 (17). 173106pp. doi:10.1063/1.2198099
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Hanke, M., Dubslaff, M., Schmidbauer, M., Wang, Zh. M., Mazur, Yu. I., Lytvyn, P. M., Lee, J. H., Salamo, G. J. (2009) On the complex behavior of strain relaxation in (In,Ga)As/GaAs(001) quantum dot molecules. Applied Physics Letters, 95 (2). 23103pp. doi:10.1063/1.3176409
Schade, M., Heyroth, F., Syrowatka, F., Leipner, H. S., Boeck, T., Hanke, M. (2007) Investigation of the chemical composition profile of SiGe∕Si(001) islands by analytical transmission electron microscopy. Applied Physics Letters, 90 (26). 263101pp. doi:10.1063/1.2751598
Schroer, C. G., Boye, P., Feldkamp, J. M., Patommel, J., Schropp, A., Schwab, A., Stephan, S., Burghammer, M., Schöder, S., Riekel, C. (2008) Coherent X-Ray Diffraction Imaging with Nanofocused Illumination. Physical Review Letters, 101 (9). doi:10.1103/physrevlett.101.090801
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