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Kawano, Yukio, Ishibashi, Koji (2010) Scanning nanoelectrometer based on a two-dimensional electron gas transistor with a probe-integrated gate electrode. Applied Physics Letters, 96 (14). 142109pp. doi:10.1063/1.3371766

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Reference TypeJournal (article/letter/editorial)
TitleScanning nanoelectrometer based on a two-dimensional electron gas transistor with a probe-integrated gate electrode
JournalApplied Physics Letters
AuthorsKawano, YukioAuthor
Ishibashi, KojiAuthor
Year2010 (April 5)Volume96
Issue14
PublisherAIP Publishing
DOIdoi:10.1063/1.3371766Search in ResearchGate
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Mindat Ref. ID8582524Long-form Identifiermindat:1:5:8582524:2
GUID0
Full ReferenceKawano, Yukio, Ishibashi, Koji (2010) Scanning nanoelectrometer based on a two-dimensional electron gas transistor with a probe-integrated gate electrode. Applied Physics Letters, 96 (14). 142109pp. doi:10.1063/1.3371766
Plain TextKawano, Yukio, Ishibashi, Koji (2010) Scanning nanoelectrometer based on a two-dimensional electron gas transistor with a probe-integrated gate electrode. Applied Physics Letters, 96 (14). 142109pp. doi:10.1063/1.3371766
In(2010, April) Applied Physics Letters Vol. 96 (14) AIP Publishing

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Yang, K. F., Liu, H. W., Nagase, K., Mishima, T. D., Santos, M. B., Hirayama, Y. (2011) Resistively detected nuclear magnetic resonance via a single InSb two-dimensional electron gas at high temperature. Applied Physics Letters, 98 (14). 142109pp. doi:10.1063/1.3579257
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Sciambi, A., Pelliccione, M., Bank, S. R., Gossard, A. C., Goldhaber-Gordon, D. (2010) Virtual scanning tunneling microscopy: A local spectroscopic probe of two-dimensional electron systems. Applied Physics Letters, 97 (13). 132103pp. doi:10.1063/1.3492440
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