Reference Type | Journal (article/letter/editorial) |
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Title | Determination of the minority carrier diffusion length in compositionally graded Cu(In,Ga)Se2 solar cells using electron beam induced current |
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Journal | Applied Physics Letters |
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Authors | Brown, Gregory | Author |
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Faifer, Vladimir | Author |
Pudov, Alex | Author |
Anikeev, Sergey | Author |
Bykov, Eugene | Author |
Contreras, Miguel | Author |
Wu, Junqiao | Author |
Year | 2010 (January 11) | Volume | 96 |
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Issue | 2 |
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Publisher | AIP Publishing |
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DOI | doi:10.1063/1.3291046Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 8583536 | Long-form Identifier | mindat:1:5:8583536:4 |
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GUID | 0 |
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Full Reference | Brown, Gregory, Faifer, Vladimir, Pudov, Alex, Anikeev, Sergey, Bykov, Eugene, Contreras, Miguel, Wu, Junqiao (2010) Determination of the minority carrier diffusion length in compositionally graded Cu(In,Ga)Se2 solar cells using electron beam induced current. Applied Physics Letters, 96 (2). 22104pp. doi:10.1063/1.3291046 |
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Plain Text | Brown, Gregory, Faifer, Vladimir, Pudov, Alex, Anikeev, Sergey, Bykov, Eugene, Contreras, Miguel, Wu, Junqiao (2010) Determination of the minority carrier diffusion length in compositionally graded Cu(In,Ga)Se2 solar cells using electron beam induced current. Applied Physics Letters, 96 (2). 22104pp. doi:10.1063/1.3291046 |
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In | (2010, January) Applied Physics Letters Vol. 96 (2) AIP Publishing |
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