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Kim, Jeehoon, Ko, Changhyun, Frenzel, Alex, Ramanathan, Shriram, Hoffman, Jennifer E. (2010) Nanoscale imaging and control of resistance switching in VO2 at room temperature. Applied Physics Letters, 96 (21). 213106pp. doi:10.1063/1.3435466

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Reference TypeJournal (article/letter/editorial)
TitleNanoscale imaging and control of resistance switching in VO2 at room temperature
JournalApplied Physics Letters
AuthorsKim, JeehoonAuthor
Ko, ChanghyunAuthor
Frenzel, AlexAuthor
Ramanathan, ShriramAuthor
Hoffman, Jennifer E.Author
Year2010 (May 24)Volume96
Issue21
PublisherAIP Publishing
DOIdoi:10.1063/1.3435466Search in ResearchGate
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Mindat Ref. ID8583869Long-form Identifiermindat:1:5:8583869:9
GUID0
Full ReferenceKim, Jeehoon, Ko, Changhyun, Frenzel, Alex, Ramanathan, Shriram, Hoffman, Jennifer E. (2010) Nanoscale imaging and control of resistance switching in VO2 at room temperature. Applied Physics Letters, 96 (21). 213106pp. doi:10.1063/1.3435466
Plain TextKim, Jeehoon, Ko, Changhyun, Frenzel, Alex, Ramanathan, Shriram, Hoffman, Jennifer E. (2010) Nanoscale imaging and control of resistance switching in VO2 at room temperature. Applied Physics Letters, 96 (21). 213106pp. doi:10.1063/1.3435466
In(2010, May) Applied Physics Letters Vol. 96 (21) AIP Publishing

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Oh, Dong-Wook, Ko, Changhyun, Ramanathan, Shriram, Cahill, David G. (2010) Thermal conductivity and dynamic heat capacity across the metal-insulator transition in thin film VO2. Applied Physics Letters, 96 (15). 151906pp. doi:10.1063/1.3394016
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Ko, Changhyun, Ramanathan, Shriram (2008) Effect of ultraviolet irradiation on electrical resistance and phase transition characteristics of thin film vanadium oxide. Journal of Applied Physics, 103 (10). 106104pp. doi:10.1063/1.2931006
Ko, Changhyun, Ramanathan, Shriram (2008) Stability of electrical switching properties in vanadium dioxide thin films under multiple thermal cycles across the phase transition boundary. Journal of Applied Physics, 104 (8). 86105pp. doi:10.1063/1.3000664
Ko, Changhyun, Ramanathan, Shriram (2008) Observation of electric field-assisted phase transition in thin film vanadium oxide in a metal-oxide-semiconductor device geometry. Applied Physics Letters, 93 (25). 252101pp. doi:10.1063/1.3050464
Ko, Changhyun, Ramanathan, Shriram (2009) Dispersive capacitance and conductance across the phase transition boundary in metal-vanadium oxide-silicon devices. Journal of Applied Physics, 106 (3). 34101pp. doi:10.1063/1.3186024
Yang, Zheng, Zhou, You, Ramanathan, Shriram (2012) Studies on room-temperature electric-field effect in ionic-liquid gated VO2 three-terminal devices. Journal of Applied Physics, 111 (1). 14506pp. doi:10.1063/1.3665399
Huefner, Magdalena, Pivonka, Adam, Kim, Jeehoon, Ye, Cun, Blood-Forsythe, Martin A., Zech, Martin, Hoffman, Jennifer E. (2012) Microcantilever Q control via capacitive coupling. Applied Physics Letters, 101 (17). 173110pp. doi:10.1063/1.4764025
 
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