Moe, Craig G., Reed, Meredith L., Garrett, Gregory A., Sampath, Anand V., Alexander, Troy, Shen, Hongen, Wraback, Michael, Bilenko, Yuriy, Shatalov, Maxim, Yang, Jinwei, Sun, Wenhong, Deng, Jianyu, Gaska, Remis (2010) Current-induced degradation of high performance deep ultraviolet light emitting diodes. Applied Physics Letters, 96 (21). 213512pp. doi:10.1063/1.3435485
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Current-induced degradation of high performance deep ultraviolet light emitting diodes | ||
| Journal | Applied Physics Letters | ||
| Authors | Moe, Craig G. | Author | |
| Reed, Meredith L. | Author | ||
| Garrett, Gregory A. | Author | ||
| Sampath, Anand V. | Author | ||
| Alexander, Troy | Author | ||
| Shen, Hongen | Author | ||
| Wraback, Michael | Author | ||
| Bilenko, Yuriy | Author | ||
| Shatalov, Maxim | Author | ||
| Yang, Jinwei | Author | ||
| Sun, Wenhong | Author | ||
| Deng, Jianyu | Author | ||
| Gaska, Remis | Author | ||
| Year | 2010 (May 24) | Volume | 96 |
| Issue | 21 | ||
| Publisher | AIP Publishing | ||
| DOI | doi:10.1063/1.3435485Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 8583899 | Long-form Identifier | mindat:1:5:8583899:0 |
| GUID | 0 | ||
| Full Reference | Moe, Craig G., Reed, Meredith L., Garrett, Gregory A., Sampath, Anand V., Alexander, Troy, Shen, Hongen, Wraback, Michael, Bilenko, Yuriy, Shatalov, Maxim, Yang, Jinwei, Sun, Wenhong, Deng, Jianyu, Gaska, Remis (2010) Current-induced degradation of high performance deep ultraviolet light emitting diodes. Applied Physics Letters, 96 (21). 213512pp. doi:10.1063/1.3435485 | ||
| Plain Text | Moe, Craig G., Reed, Meredith L., Garrett, Gregory A., Sampath, Anand V., Alexander, Troy, Shen, Hongen, Wraback, Michael, Bilenko, Yuriy, Shatalov, Maxim, Yang, Jinwei, Sun, Wenhong, Deng, Jianyu, Gaska, Remis (2010) Current-induced degradation of high performance deep ultraviolet light emitting diodes. Applied Physics Letters, 96 (21). 213512pp. doi:10.1063/1.3435485 | ||
| In | (2010, May) Applied Physics Letters Vol. 96 (21) AIP Publishing | ||
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