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David, A., Boullay, Ph., Mangalam, R. V. K., Barrier, N., Prellier, W. (2010) Microstructure of epitaxial strained BiCrO3 thin films. Applied Physics Letters, 96 (22). 221904pp. doi:10.1063/1.3435486

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Reference TypeJournal (article/letter/editorial)
TitleMicrostructure of epitaxial strained BiCrO3 thin films
JournalApplied Physics Letters
AuthorsDavid, A.Author
Boullay, Ph.Author
Mangalam, R. V. K.Author
Barrier, N.Author
Prellier, W.Author
Year2010 (May 31)Volume96
Issue22
PublisherAIP Publishing
DOIdoi:10.1063/1.3435486Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID8584018Long-form Identifiermindat:1:5:8584018:0
GUID0
Full ReferenceDavid, A., Boullay, Ph., Mangalam, R. V. K., Barrier, N., Prellier, W. (2010) Microstructure of epitaxial strained BiCrO3 thin films. Applied Physics Letters, 96 (22). 221904pp. doi:10.1063/1.3435486
Plain TextDavid, A., Boullay, Ph., Mangalam, R. V. K., Barrier, N., Prellier, W. (2010) Microstructure of epitaxial strained BiCrO3 thin films. Applied Physics Letters, 96 (22). 221904pp. doi:10.1063/1.3435486
In(2010, May) Applied Physics Letters Vol. 96 (22) AIP Publishing

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