Hempel, Martin, Ziegler, Mathias, Tomm, Jens W., Elsaesser, Thomas, Michel, Nicolas, Krakowski, Michel (2010) Time-resolved analysis of catastrophic optical damage in 975 nm emitting diode lasers. Applied Physics Letters, 96 (25). 251105pp. doi:10.1063/1.3456388
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Time-resolved analysis of catastrophic optical damage in 975 nm emitting diode lasers | ||
Journal | Applied Physics Letters | ||
Authors | Hempel, Martin | Author | |
Ziegler, Mathias | Author | ||
Tomm, Jens W. | Author | ||
Elsaesser, Thomas | Author | ||
Michel, Nicolas | Author | ||
Krakowski, Michel | Author | ||
Year | 2010 (June 21) | Volume | 96 |
Issue | 25 | ||
Publisher | AIP Publishing | ||
DOI | doi:10.1063/1.3456388Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 8584567 | Long-form Identifier | mindat:1:5:8584567:1 |
GUID | 0 | ||
Full Reference | Hempel, Martin, Ziegler, Mathias, Tomm, Jens W., Elsaesser, Thomas, Michel, Nicolas, Krakowski, Michel (2010) Time-resolved analysis of catastrophic optical damage in 975 nm emitting diode lasers. Applied Physics Letters, 96 (25). 251105pp. doi:10.1063/1.3456388 | ||
Plain Text | Hempel, Martin, Ziegler, Mathias, Tomm, Jens W., Elsaesser, Thomas, Michel, Nicolas, Krakowski, Michel (2010) Time-resolved analysis of catastrophic optical damage in 975 nm emitting diode lasers. Applied Physics Letters, 96 (25). 251105pp. doi:10.1063/1.3456388 | ||
In | (2010, June) Applied Physics Letters Vol. 96 (25) AIP Publishing |
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