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Lau, J. W., Morrow, P., Read, J. C., Höink, V., Egelhoff, W. F., Huang, L., Zhu, Y. (2010) In situ tunneling measurements in a transmission electron microscope on nanomagnetic tunnel junctions. Applied Physics Letters, 96 (26). 262508pp. doi:10.1063/1.3446841

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Reference TypeJournal (article/letter/editorial)
TitleIn situ tunneling measurements in a transmission electron microscope on nanomagnetic tunnel junctions
JournalApplied Physics Letters
AuthorsLau, J. W.Author
Morrow, P.Author
Read, J. C.Author
Höink, V.Author
Egelhoff, W. F.Author
Huang, L.Author
Zhu, Y.Author
Year2010 (June 28)Volume96
Issue26
PublisherAIP Publishing
DOIdoi:10.1063/1.3446841Search in ResearchGate
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Mindat Ref. ID8584637Long-form Identifiermindat:1:5:8584637:9
GUID0
Full ReferenceLau, J. W., Morrow, P., Read, J. C., Höink, V., Egelhoff, W. F., Huang, L., Zhu, Y. (2010) In situ tunneling measurements in a transmission electron microscope on nanomagnetic tunnel junctions. Applied Physics Letters, 96 (26). 262508pp. doi:10.1063/1.3446841
Plain TextLau, J. W., Morrow, P., Read, J. C., Höink, V., Egelhoff, W. F., Huang, L., Zhu, Y. (2010) In situ tunneling measurements in a transmission electron microscope on nanomagnetic tunnel junctions. Applied Physics Letters, 96 (26). 262508pp. doi:10.1063/1.3446841
In(2010, June) Applied Physics Letters Vol. 96 (26) AIP Publishing

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