Kim, Soon-Wook, Lee, Sung Kyun, Do Kim, Young, Kim, Sibum (2010) Effects of electrical stress on the leakage current characteristics of multilayer capacitor structures. Applied Physics Letters, 96 (26). 262904pp. doi:10.1063/1.3456731
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Effects of electrical stress on the leakage current characteristics of multilayer capacitor structures | ||
Journal | Applied Physics Letters | ||
Authors | Kim, Soon-Wook | Author | |
Lee, Sung Kyun | Author | ||
Do Kim, Young | Author | ||
Kim, Sibum | Author | ||
Year | 2010 (June 28) | Volume | 96 |
Issue | 26 | ||
Publisher | AIP Publishing | ||
DOI | doi:10.1063/1.3456731Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 8584678 | Long-form Identifier | mindat:1:5:8584678:6 |
GUID | 0 | ||
Full Reference | Kim, Soon-Wook, Lee, Sung Kyun, Do Kim, Young, Kim, Sibum (2010) Effects of electrical stress on the leakage current characteristics of multilayer capacitor structures. Applied Physics Letters, 96 (26). 262904pp. doi:10.1063/1.3456731 | ||
Plain Text | Kim, Soon-Wook, Lee, Sung Kyun, Do Kim, Young, Kim, Sibum (2010) Effects of electrical stress on the leakage current characteristics of multilayer capacitor structures. Applied Physics Letters, 96 (26). 262904pp. doi:10.1063/1.3456731 | ||
In | (2010, June) Applied Physics Letters Vol. 96 (26) AIP Publishing |
See Also
These are possibly similar items as determined by title/reference text matching only.