Reference Type | Journal (article/letter/editorial) |
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Title | Mechanism for excess noise in mixed tunneling and avalanche breakdown of silicon |
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Journal | Applied Physics Letters |
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Authors | Pan, Andrew | Author |
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Pan, Dee-Son | Author |
Chui, Chi On | Author |
Year | 2010 (June 28) | Volume | 96 |
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Issue | 26 |
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Publisher | AIP Publishing |
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DOI | doi:10.1063/1.3457468Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 8584692 | Long-form Identifier | mindat:1:5:8584692:6 |
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GUID | 0 |
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Full Reference | Pan, Andrew, Pan, Dee-Son, Chui, Chi On (2010) Mechanism for excess noise in mixed tunneling and avalanche breakdown of silicon. Applied Physics Letters, 96 (26). 263503pp. doi:10.1063/1.3457468 |
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Plain Text | Pan, Andrew, Pan, Dee-Son, Chui, Chi On (2010) Mechanism for excess noise in mixed tunneling and avalanche breakdown of silicon. Applied Physics Letters, 96 (26). 263503pp. doi:10.1063/1.3457468 |
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In | (2010, June) Applied Physics Letters Vol. 96 (26) AIP Publishing |
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