Reference Type | Journal (article/letter/editorial) |
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Title | Effect of structural relaxation and oxidation conditions on interlayer exchange coupling in Fe|MgO|Fe tunnel junctions |
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Journal | Applied Physics Letters |
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Authors | Yang, H. X. | Author |
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Chshiev, M. | Author |
Kalitsov, A. | Author |
Schuhl, A. | Author |
Butler, W. H. | Author |
Year | 2010 (June 28) | Volume | 96 |
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Issue | 26 |
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Publisher | AIP Publishing |
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DOI | doi:10.1063/1.3459148Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 8584788 | Long-form Identifier | mindat:1:5:8584788:2 |
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GUID | 0 |
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Full Reference | Yang, H. X., Chshiev, M., Kalitsov, A., Schuhl, A., Butler, W. H. (2010) Effect of structural relaxation and oxidation conditions on interlayer exchange coupling in Fe|MgO|Fe tunnel junctions. Applied Physics Letters, 96 (26). 262509pp. doi:10.1063/1.3459148 |
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Plain Text | Yang, H. X., Chshiev, M., Kalitsov, A., Schuhl, A., Butler, W. H. (2010) Effect of structural relaxation and oxidation conditions on interlayer exchange coupling in Fe|MgO|Fe tunnel junctions. Applied Physics Letters, 96 (26). 262509pp. doi:10.1063/1.3459148 |
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In | (2010, June) Applied Physics Letters Vol. 96 (26) AIP Publishing |
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