Reference Type | Journal (article/letter/editorial) |
---|
Title | Wide-band capacitance measurement on a semiconductor double quantum dot for studying tunneling dynamics |
---|
Journal | Applied Physics Letters |
---|
Authors | Ota, Takeshi | Author |
---|
Hayashi, Toshiaki | Author |
Muraki, Koji | Author |
Fujisawa, Toshimasa | Author |
Year | 2010 (January 18) | Volume | 96 |
---|
Issue | 3 |
---|
Publisher | AIP Publishing |
---|
DOI | doi:10.1063/1.3285180Search in ResearchGate |
---|
| Generate Citation Formats |
Mindat Ref. ID | 8584846 | Long-form Identifier | mindat:1:5:8584846:5 |
---|
|
GUID | 0 |
---|
Full Reference | Ota, Takeshi, Hayashi, Toshiaki, Muraki, Koji, Fujisawa, Toshimasa (2010) Wide-band capacitance measurement on a semiconductor double quantum dot for studying tunneling dynamics. Applied Physics Letters, 96 (3). 32104pp. doi:10.1063/1.3285180 |
---|
Plain Text | Ota, Takeshi, Hayashi, Toshiaki, Muraki, Koji, Fujisawa, Toshimasa (2010) Wide-band capacitance measurement on a semiconductor double quantum dot for studying tunneling dynamics. Applied Physics Letters, 96 (3). 32104pp. doi:10.1063/1.3285180 |
---|
In | (2010, January) Applied Physics Letters Vol. 96 (3) AIP Publishing |
---|
These are possibly similar items as determined by title/reference text matching only.