Liu, Jingle, Zhang, X.-C. (2010) Plasma characterization using terahertz-wave-enhanced fluorescence. Applied Physics Letters, 96 (4). 41505pp. doi:10.1063/1.3291676
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Plasma characterization using terahertz-wave-enhanced fluorescence | ||
Journal | Applied Physics Letters | ||
Authors | Liu, Jingle | Author | |
Zhang, X.-C. | Author | ||
Year | 2010 (January 25) | Volume | 96 |
Issue | 4 | ||
Publisher | AIP Publishing | ||
DOI | doi:10.1063/1.3291676Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 8584983 | Long-form Identifier | mindat:1:5:8584983:5 |
GUID | 0 | ||
Full Reference | Liu, Jingle, Zhang, X.-C. (2010) Plasma characterization using terahertz-wave-enhanced fluorescence. Applied Physics Letters, 96 (4). 41505pp. doi:10.1063/1.3291676 | ||
Plain Text | Liu, Jingle, Zhang, X.-C. (2010) Plasma characterization using terahertz-wave-enhanced fluorescence. Applied Physics Letters, 96 (4). 41505pp. doi:10.1063/1.3291676 | ||
In | (2010, January) Applied Physics Letters Vol. 96 (4) AIP Publishing |
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