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Lee, Jeong Hoon, Hwang, Kyo Seon, Kim, Tae Song (2010) Microstress relaxation effect of Pb(Zr0.52Ti0.48)O3 films with thicknesses for micro/nanopiezoelectric device. Applied Physics Letters, 96 (9). 92904pp. doi:10.1063/1.3330897

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Reference TypeJournal (article/letter/editorial)
TitleMicrostress relaxation effect of Pb(Zr0.52Ti0.48)O3 films with thicknesses for micro/nanopiezoelectric device
JournalApplied Physics Letters
AuthorsLee, Jeong HoonAuthor
Hwang, Kyo SeonAuthor
Kim, Tae SongAuthor
Year2010 (March)Volume96
Issue9
PublisherAIP Publishing
DOIdoi:10.1063/1.3330897Search in ResearchGate
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Mindat Ref. ID8586003Long-form Identifiermindat:1:5:8586003:2
GUID0
Full ReferenceLee, Jeong Hoon, Hwang, Kyo Seon, Kim, Tae Song (2010) Microstress relaxation effect of Pb(Zr0.52Ti0.48)O3 films with thicknesses for micro/nanopiezoelectric device. Applied Physics Letters, 96 (9). 92904pp. doi:10.1063/1.3330897
Plain TextLee, Jeong Hoon, Hwang, Kyo Seon, Kim, Tae Song (2010) Microstress relaxation effect of Pb(Zr0.52Ti0.48)O3 films with thicknesses for micro/nanopiezoelectric device. Applied Physics Letters, 96 (9). 92904pp. doi:10.1063/1.3330897
In(2010, March) Applied Physics Letters Vol. 96 (9) AIP Publishing

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