Reference Type | Journal (article/letter/editorial) |
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Title | Charge modulated reflectance topography for probing in-plane carrier distribution in pentacene field-effect transistors |
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Journal | Applied Physics Letters |
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Authors | Manaka, Takaaki | Author |
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Kawashima, Satoshi | Author |
Iwamoto, Mitsumasa | Author |
Year | 2010 (September 13) | Volume | 97 |
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Issue | 11 |
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Publisher | AIP Publishing |
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DOI | doi:10.1063/1.3490716Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 8586583 | Long-form Identifier | mindat:1:5:8586583:3 |
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GUID | 0 |
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Full Reference | Manaka, Takaaki, Kawashima, Satoshi, Iwamoto, Mitsumasa (2010) Charge modulated reflectance topography for probing in-plane carrier distribution in pentacene field-effect transistors. Applied Physics Letters, 97 (11). 113302pp. doi:10.1063/1.3490716 |
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Plain Text | Manaka, Takaaki, Kawashima, Satoshi, Iwamoto, Mitsumasa (2010) Charge modulated reflectance topography for probing in-plane carrier distribution in pentacene field-effect transistors. Applied Physics Letters, 97 (11). 113302pp. doi:10.1063/1.3490716 |
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In | (2010, September) Applied Physics Letters Vol. 97 (11) AIP Publishing |
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