Reference Type | Journal (article/letter/editorial) |
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Title | Ultrashallow Ohmic contacts for n-type Ge by Sb δ-doping |
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Journal | Applied Physics Letters |
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Authors | Sawano, K. | Author |
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Hoshi, Y. | Author |
Kasahara, K. | Author |
Yamane, K. | Author |
Hamaya, K. | Author |
Miyao, M. | Author |
Shiraki, Y. | Author |
Year | 2010 (October 18) | Volume | 97 |
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Issue | 16 |
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Publisher | AIP Publishing |
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DOI | doi:10.1063/1.3503587Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 8587450 | Long-form Identifier | mindat:1:5:8587450:3 |
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GUID | 0 |
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Full Reference | Sawano, K., Hoshi, Y., Kasahara, K., Yamane, K., Hamaya, K., Miyao, M., Shiraki, Y. (2010) Ultrashallow Ohmic contacts for n-type Ge by Sb δ-doping. Applied Physics Letters, 97 (16). 162108pp. doi:10.1063/1.3503587 |
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Plain Text | Sawano, K., Hoshi, Y., Kasahara, K., Yamane, K., Hamaya, K., Miyao, M., Shiraki, Y. (2010) Ultrashallow Ohmic contacts for n-type Ge by Sb δ-doping. Applied Physics Letters, 97 (16). 162108pp. doi:10.1063/1.3503587 |
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In | (2010, October) Applied Physics Letters Vol. 97 (16) AIP Publishing |
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