Reference Type | Journal (article/letter/editorial) |
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Title | Effect of germanium on the kinetics of boron-oxygen defect generation and dissociation in Czochralski silicon |
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Journal | Applied Physics Letters |
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Authors | Yu, Xuegong | Author |
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Wang, Peng | Author |
Yang, Deren | Author |
Year | 2010 (October 18) | Volume | 97 |
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Issue | 16 |
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Publisher | AIP Publishing |
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DOI | doi:10.1063/1.3505499Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 8587540 | Long-form Identifier | mindat:1:5:8587540:5 |
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GUID | 0 |
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Full Reference | Yu, Xuegong, Wang, Peng, Yang, Deren (2010) Effect of germanium on the kinetics of boron-oxygen defect generation and dissociation in Czochralski silicon. Applied Physics Letters, 97 (16). 162107pp. doi:10.1063/1.3505499 |
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Plain Text | Yu, Xuegong, Wang, Peng, Yang, Deren (2010) Effect of germanium on the kinetics of boron-oxygen defect generation and dissociation in Czochralski silicon. Applied Physics Letters, 97 (16). 162107pp. doi:10.1063/1.3505499 |
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In | (2010, October) Applied Physics Letters Vol. 97 (16) AIP Publishing |
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