Kamata, Isaho, Zhang, Xuan, Tsuchida, Hidekazu (2010) Photoluminescence of Frank-type defects on the basal plane in 4H–SiC epilayers. Applied Physics Letters, 97 (17). 172107pp. doi:10.1063/1.3499431
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Photoluminescence of Frank-type defects on the basal plane in 4H–SiC epilayers | ||
| Journal | Applied Physics Letters | ||
| Authors | Kamata, Isaho | Author | |
| Zhang, Xuan | Author | ||
| Tsuchida, Hidekazu | Author | ||
| Year | 2010 (October 25) | Volume | 97 |
| Issue | 17 | ||
| Publisher | AIP Publishing | ||
| DOI | doi:10.1063/1.3499431Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 8587561 | Long-form Identifier | mindat:1:5:8587561:8 |
| GUID | 0 | ||
| Full Reference | Kamata, Isaho, Zhang, Xuan, Tsuchida, Hidekazu (2010) Photoluminescence of Frank-type defects on the basal plane in 4H–SiC epilayers. Applied Physics Letters, 97 (17). 172107pp. doi:10.1063/1.3499431 | ||
| Plain Text | Kamata, Isaho, Zhang, Xuan, Tsuchida, Hidekazu (2010) Photoluminescence of Frank-type defects on the basal plane in 4H–SiC epilayers. Applied Physics Letters, 97 (17). 172107pp. doi:10.1063/1.3499431 | ||
| In | (2010, October) Applied Physics Letters Vol. 97 (17) AIP Publishing | ||
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